Mingjing Chen

According to our database, Mingjing Chen authored at least 22 papers between 2006 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Determinants of patients' service choice in online health communities: an elaboration likelihood model perspective.

Yuangao Chen, Meng Liu, Mingjing Chen, Lu Wang, Le Sun, Gang Xuan

Libr. Hi Tech, 2024

2021

Sleep apnea screening based on Photoplethysmography data from wearable bracelets using an information-based similarity approach.

Shan Wu, Mingjing Chen, Keming Wei, Guanzheng Liu

Comput. Methods Programs Biomed., 2021

2019

Empirical Mode Decomposition as a Novel Approach to Study Heart Rate Variability in Congestive Heart Failure Assessment.

Mingjing Chen, Aodi He, Kaicheng Feng, Guanzheng Liu, Qian Wang

Entropy, 2019

2014

Examining Timing Path Robustness Under Wide-Bandwidth Power Supply Noise Through Multi-Functional-Cycle Delay Test.

Mingjing Chen, Alex Orailoglu

IEEE Trans. Very Large Scale Integr. Syst., 2014

2012

Tackling nanoscale IC failures through noise-aware testing and silicon debugging.

Mingjing Chen

PhD thesis, 2012

Scan Power Reduction for Linear Test Compression Schemes Through Seed Selection.

Mingjing Chen, Alex Orailoglu

IEEE Trans. Very Large Scale Integr. Syst., 2012

On Diagnosis of Timing Failures in Scan Architecture.

Mingjing Chen, Alex Orailoglu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

2011

Diagnosing scan chain timing faults through statistical feature analysis of scan images.

Mingjing Chen, Alex Orailoglu

Proceedings of the Design, Automation and Test in Europe, 2011

Diagnosing scan clock delay faults through statistical timing pruning.

Mingjing Chen, Alex Orailoglu

Proceedings of the 48th Design Automation Conference, 2011

2010

Squashing code size in microcoded IPs while delivering high decompression speed.

Chengmo Yang, Mingjing Chen, Alex Orailoglu

Des. Autom. Embed. Syst., 2010

VDDmin test optimization for overscreening minimization through adaptive scan chain masking.

Mingjing Chen, Alex Orailoglu

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme.

Mingjing Chen, Alex Orailoglu

Proceedings of the Design, Automation and Test in Europe, 2010

2009

Scan power reduction in linear test data compression scheme.

Mingjing Chen, Alex Orailoglu

Proceedings of the 2009 International Conference on Computer-Aided Design, 2009

Deflecting crosstalk by routing reconsideration through refined signal correlation estimation.

Mingjing Chen, Alex Orailoglu

Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, 2009

Flip-Flop Hardening and Selection for Soft Error and Delay Fault Resilience.

Mingjing Chen, Alex Orailoglu

Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009

Squashing microcode stores to size in embedded systems while delivering rapid microcode accesses.

Chengmo Yang, Mingjing Chen, Alex Orailoglu

Proceedings of the 7th International Conference on Hardware/Software Codesign and System Synthesis, 2009

2008

Scan BIST with biased scan test signals.

Dong Xiang, Mingjing Chen, Jia-Guang Sun

Sci. China Ser. F Inf. Sci., 2008

Test cost minimization through adaptive test development.

Mingjing Chen, Alex Orailoglu

Proceedings of the 26th International Conference on Computer Design, 2008

2007

Using Weighted Scan Enable Signals to Improve Test Effectiveness of Scan-Based BIST.

Dong Xiang, Mingjing Chen, Hideo Fujiwara

IEEE Trans. Computers, 2007

Circuit-level mismatch modelling and yield optimization for CMOS analog circuits.

Mingjing Chen, Alex Orailoglu

Proceedings of the 25th International Conference on Computer Design, 2007

Improving Circuit Robustness with Cost-Effective Soft-Error-Tolerant Sequential Elements.

Mingjing Chen, Alex Orailoglu

Proceedings of the 16th Asian Test Symposium, 2007

2006

Decision Tree Based Mismatch Diagnosis in Analog Circuits.

Mingjing Chen, Hosam Haggag, Alex Orailoglu

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006