Ming-Fu Tsai
According to our database1,
Ming-Fu Tsai
authored at least 7 papers
between 2001 and 2012.
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Bibliography
2012
Impacts of random telegraph noise on the analog properties of FinFET and trigate devices and Widlar current source.
Proceedings of the IEEE International Conference on IC Design & Technology, 2012
A comparative analysis of tunneling FET circuit switching characteristics and SRAM stability and performance.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2012
A comprehensive comparative analysis of FinFET and Trigate device, SRAM and logic circuits.
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2012
2003
Efficient Double Fault Diagnosis for CMOS Logic Circuits With a Specific Application to Generic Bridging Faults.
J. Inf. Sci. Eng., 2003
2002
Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002
2001
Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories.
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001