Mincent Lee

According to our database, Mincent Lee authored at least 16 papers between 2011 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2022

A Memory Built-In Peer-Repair Architecture for Mesh-Connected Processor Array.

Pai-Yu Tan, Chih-Hsuan Tung, Cheng-Wen Wu, Mincent Lee, Gordon Liao

Proceedings of the 2022 International Symposium on VLSI Design, Automation and Test, 2022

2020

A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices.

Chien-Hui Chuang, Kuan-Wei Hou, Cheng-Wen Wu, Mincent Lee, Chia-Heng Tsai, Hao Chen, Min-Jer Wang

Proceedings of the IEEE International Test Conference, 2020

Site-aware Anomaly Detection with Machine Learning for Circuit Probing to Prevent Overkill.

Mincent Lee, Cheng-Tse Lu, Chia-Heng Tsai, Hao Chen, Min-Jer Wang

Proceedings of the IEEE International Test Conference in Asia, 2020

2019

High Quality Test Methodology for Highly Reliable Devices.

Hao Chen, Mincent Lee, Liang-Yen Chen, Min-Jer Wang

Proceedings of the IEEE International Test Conference, 2019

2017

A Built-Off Self-Repair Scheme for Channel-Based 3D Memories.

Hsuan-Hung Liu, Bing-Yang Lin, Cheng-Wen Wu, Wan-Ting Chiang, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang

IEEE Trans. Computers, 2017

Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package.

Kai-Li Wang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang

IEEE Des. Test, 2017

2016

A Local Parallel Search Approach for Memory Failure Pattern Identification.

Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang

IEEE Trans. Computers, 2016

Configurable Cubical Redundancy Schemes for Channel-Based 3-D DRAM Yield Improvement.

Bing-Yang Lin, Wan-Ting Chiang, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang

IEEE Des. Test, 2016

Efficient probing schemes for fine-pitch pads of InFO wafer-level chip-scale package.

Yu-Chieh Huang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang

Proceedings of the 53rd Annual Design Automation Conference, 2016

2014

A novel DFT architecture for 3DIC test, diagnosis and repair.

Mincent Lee, Saman Adham, Min-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, Hao Chen

Proceedings of the Technical Papers of 2014 International Symposium on VLSI Design, 2014

Redundancy architectures for channel-based 3D DRAM yield improvement.

Bing-Yang Lin, Wan-Ting Chiang, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang

Proceedings of the 2014 International Test Conference, 2014

2013

Exploration Methodology for 3D Memory Redundancy Architectures under Redundancy Constraints.

Bing-Yang Lin, Mincent Lee, Cheng-Wen Wu

Proceedings of the 22nd Asian Test Symposium, 2013

2012

A Memory Failure Pattern Analyzer for memory diagnosis and repair.

Bing-Yang Lin, Mincent Lee, Cheng-Wen Wu

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Cost modeling and analysis for interposer-based three-dimensional IC.

Ying-Wen Chou, Po-Yuan Chen, Mincent Lee, Cheng-Wen Wu

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

A memory yield improvement scheme combining built-in self-repair and error correction codes.

Tze-Hsin Wu, Po-Yuan Chen, Mincent Lee, Bin-Yen Lin, Cheng-Wen Wu, Chen-Hung Tien, Hung-Chih Lin, Hao Chen, Ching-Nen Peng, Min-Jer Wang

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

A Memory Built-In Self-Repair Scheme Based on Configurable Spares.

Mincent Lee, Li-Ming Denq, Cheng-Wen Wu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011