Min-Tai Yu
According to our database1,
Min-Tai Yu
authored at least 2 papers
between 2023 and 2024.
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Bibliography
2024
Innovative Barrier Metal-Less Metal Gate Scheme Leading to Highly Reliable Cell Characteristics for 8th Generation 512Gb 3D NAND Flash Memory.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
2023
Novel Strategies for Highly Uniform and Reliable Cell Characteristics of 8th Generation 1Tb 3D-NAND Flash Memory.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023