Min-Chun Hu

Affiliations:
  • National Tsing-Hua University, Department of Electrical Engineering, Hsinchu, Taiwan
  • Cadence Design Systems, Endicott, NY, USA


According to our database1, Min-Chun Hu authored at least 5 papers between 2019 and 2024.

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Bibliography

2024
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology.
IEEE Des. Test, 2024

2021
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality.
J. Electron. Test., 2021

2020
Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults.
Proceedings of the IEEE European Test Symposium, 2020

2019
Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library.
Proceedings of the IEEE International Test Conference, 2019

Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices.
Proceedings of the IEEE International Test Conference in Asia, 2019


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