Milan Tapajna

Orcid: 0000-0003-1099-2050

According to our database¹, Milan Tapajna authored at least 3 papers between 2006 and 2012.

Collaborative distances:

Dijkstra number² of six.
Erdős number³ of five.

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PhD thesis

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Bibliography

2012

The role of surface barrier oxidation on AlGaN/GaN HEMTs reliability.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2012

2011

AlGaN/GaN HEMT device reliability and degradation evolution: Importance of diffusion processes.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2011

2006

Czochralski-grown nitrogen-doped silicon: Electrical properties of MOS structures; A positron annihilation study.

[BibT_eX]

[DOI]

Microelectron. J., 2006

Milan Tapajna

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