Mike W. T. Wong

According to our database, Mike W. T. Wong authored at least 18 papers between 1995 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2004

Design and Implementation of Self-Testable Full Range Window Comparator.

Mike W. T. Wong, Yubin Zhang

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

2003

Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis.

Mike W. T. Wong

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

2002

Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis.

Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee

Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

Analog and Mixed-Signal IP Cores Testing.

Mike W. T. Wong, K. Y. Ko, Yim-Shu Lee

Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

Testing System-On-Chip by Summations of Cores? Test Output Voltages.

K. Y. Ko, Mike W. T. Wong, Yim-Shu Lee

Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

2001

The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study.

Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee

Proceedings of the 6th European Test Workshop, 2001

2000

On the issues of oscillation test methodology.

Mike Wai-Tak Wong

IEEE Trans. Instrum. Meas., 2000

Non‐linear analog circuit fault diagnosis with large change sensitivity.

Matthew Worsman, Mike W. T. Wong

Int. J. Circuit Theory Appl., 2000

A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality.

Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee

Proceedings of the 1st International Symposium on Quality of Electronic Design (ISQED 2000), 2000

Analog circuit equivalent faults in the D.C. domain.

Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

New built-in self-test technique based on addition/subtraction of selected node voltages.

K. Y. Ko, Mike W. T. Wong

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

1998

On concurrent multiple error diagnosability in linear analog circuits using continuous checksum.

Yingquan Zhou, Mike W. T. Wong, Yinghua Min

Int. J. Circuit Theory Appl., 1998

Nonlinear circuit fault diagnosis with large change sensitivity.

Matthew Worsman, Mike W. T. Wong

Proceedings of the 5th IEEE International Conference on Electronics, Circuits and Systems, 1998

DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity.

Mike W. T. Wong, Matthew Worsman

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1997

Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits.

Joseph C. W. Pang, Mike W. T. Wong, Yim-Shu Lee

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1996

Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis.

Yingquan Zhou, Mike W. T. Wong, Yinghua Min

J. Electron. Test., 1996

Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation.

Tao Wei, Mike W. T. Wong, Yim-Shu Lee

Proceedings of the 5th Asian Test Symposium (ATS '96), 1996

1995

Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers.

Yingquan Zhou, Mike W. T. Wong, Yinghua Min

Proceedings of the Digest of Papers: FTCS-25, 1995