Mike Rodgers

According to our database, Mike Rodgers authored at least 16 papers between 2000 and 2006.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2006

Session Abstract.

Ajay Khoche, Mike Rodgers, Pete O'Neil

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

2004

Linked faults in random access memories: concept, fault models, test algorithms, and industrial results.

Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004

2003 Technology Roadmap for Semiconductors.

Don Edenfeld, Andrew B. Kahng, Mike Rodgers, Yervant Zorian

Computer, 2004

2003

Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests.

Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers

J. Electron. Test., 2003

Detecting Intra-Word Faults in Word-Oriented Memories.

Said Hamdioui, Ad J. van de Goor, Mike Rodgers

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

March SL: A Test For All Static Linked Memory Faults.

Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

2002

2001 Technology Roadmap for Semiconductors.

Alan Allan, Don Edenfeld, William H. Joyner Jr., Andrew B. Kahng, Mike Rodgers, Yervant Zorian

Computer, 2002

Debating the Future of Burn-In.

Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

March SS: A Test for All Static Simple RAM Faults.

Said Hamdioui, Ad J. van de Goor, Mike Rodgers

Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

2001

ITRS Test Chapter 2001: We'll Tell You What We're Doing, You Tell Us What We Should Be Doing.

Mike Rodgers

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Realistic Fault Models and Test Procedures for Multi-Port SRAMs.

Said Hamdioui, Ad J. van de Goor, David Eastwick, Mike Rodgers

Proceedings of the 9th IEEE International Workshop on Memory Technology, 2001

Detecting Unique Faults in Multi-port SRAMs.

Said Hamdioui, Ad J. van de Goor, David Eastwick, Mike Rodgers

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

2000

March Tests for Realistic Faults in Two-Port Memories.

Said Hamdioui, Ad J. van de Goor, Mike Rodgers, David Eastwick

Proceedings of the 8th IEEE International Workshop on Memory Technology, 2000

Defect screening challenges in the Gigahertz/Nanometer age: keeping up with the tails of defect behaviors.

Mike Rodgers

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

Test of Future System-on-Chips.

Yervant Zorian, Sujit Dey, Mike Rodgers

Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000

Test challenges for deep sub-micron technologies.

Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik Roy

Proceedings of the 37th Conference on Design Automation, 2000