Mick Tegethoff

According to our database, Mick Tegethoff authored at least 16 papers between 1992 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

OCI: Open Compression Interface.

Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie

Proceedings of the 2006 IEEE International Test Conference, 2006

Not all Delay Tests Are the Same - SDQL Model Shows True-Time.

Anis Uzzaman, Mick Tegethoff, Bibo Li, Kevin McCauley, Shuji Hamada, Yasuo Sato

Proceedings of the 15th Asian Test Symposium, 2006

2004

An Economic Analysis and ROI Model for Nanometer Test.

Brion L. Keller, Mick Tegethoff, Thomas Bartenstein, Vivek Chickermane

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2001

A new methodology for improved tester utilization.

Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1999

Fault Coverage Estimation for Early Stage of VLSI Design.

Von-Kyoung Kim, Tom Chen, Mick Tegethoff

Proceedings of the 9th Great Lakes Symposium on VLSI (GLS-VLSI '99), 1999

1997

Simulation Techniques for the Manufacturing Test of MCMs.

Mick Tegethoff, Tom Chen

J. Electron. Test., 1997

ASIC Manufacturing Test Cost Prediction at Early Design Stage.

Von-Kyoung Kim, Tom Chen, Mick Tegethoff

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

Sensitivity Analysis of Critical Parameters in Board Test.

Mick Tegethoff, Tom Chen

IEEE Des. Test Comput., 1996

Opens Board Test Coverage: When is 99% Really 40%?

Mick Tegethoff, Kenneth P. Parker, Ken Lee

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

ASIC Yield Estimation at Early Design Cycle.

Von-Kyoung Kim, Mick Tegethoff, Tom Chen

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

Issues in Optimizing the Test Process - A Telecom Case Study.

Felix Frayman, Mick Tegethoff, Brenton White

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

IEEE Std 1149.1: Where Are We? Where From Here?

Mick Tegethoff, Kenneth P. Parker

IEEE Des. Test Comput., 1995

1994

Manufacturing-Test Simulator: A Concurrent-Engineering Tool for Boards and MCMs.

Mick Tegethoff, Tom Chen

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

Defects, Fault Coverage, Yield and Cost in Board Manufacturing.

Mick Tegethoff, Tom Chen

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

IEEE 1149.1: How to Justify Implementation.

Mick Tegethoff

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

Board Test DFT Model for Computer Products.

Mick Tegethoff, T. E. Figal, S. W. Hird

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992