Michitarou Yabuuchi

According to our database, Michitarou Yabuuchi authored at least 7 papers between 2010 and 2023.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2023

Ultra Long-term Measurement Results of BTI-induced Aging Degradation on 7-nm Ring Oscillators.

Kazutoshi Kobayashi, Tomoharu Kishita, Hiroki Nakano, Jun Furuta, Mitsuhiko Igarashi, Shigetaka Kumashiro, Michitarou Yabuuchi, Hironori Sakamoto

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2017

Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS Model.

Takuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2017

Circuit-level simulation methodology for Random Telegraph Noise by using Verilog-AMS.

Takuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi

Proceedings of the 2017 IEEE International Conference on IC Design and Technology, 2017

2016

Size Optimization Technique for Logic Circuits that Considers BTI and Process Variations.

Michitarou Yabuuchi, Kazutoshi Kobayashi

IPSJ Trans. Syst. LSI Des. Methodol., 2016

2014

Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs.

Michitarou Yabuuchi, Ryo Kishida, Kazutoshi Kobayashi

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2014

2012

NBTI-Induced Delay Degradation Analysis of FPGA Routing Structures.

Michitarou Yabuuchi, Kazutoshi Kobayashi

IPSJ Trans. Syst. LSI Des. Methodol., 2012

2010

Evaluation of FPGA design guardband caused by inhomogeneous NBTI degradation considering process variations.

Michitarou Yabuuchi, Kazutoshi Kobayashi

Proceedings of the International Conference on Field-Programmable Technology, 2010