Michiaki Muraoka

According to our database1, Michiaki Muraoka authored at least 18 papers between 1982 and 2014.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2014
A critical net reshape-router for high-performance VLSI layout design.
Proceedings of the 2014 IEEE Asia Pacific Conference on Circuits and Systems, 2014

2013
A multilayer crosstalk avoidance router using restricted maze grids.
Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013

2004
A DFT Selection Method for Reducing Test Application Time of System-on-Chips.
IEICE Trans. Inf. Syst., 2004

Design methodology for SoC arthitectures based on reusable virtual cores.
Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, 2004

2003
A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint.
Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

VCore-based platform for SoC design.
Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003

Synthesis for SoC architecture using VCores.
Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003

VCore-based design methodology.
Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003

VCDS tool demonstration.
Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003

2002
A Test Generation Method Using a Compacted Test Table and a Test Generation Method Using a Compacted Test Plan Table for RTL Data Path Circuits.
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

A State Reduction Method for Non-Scan Based FSM Testing with Don't Care Inputs Identification Technique.
Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

A SoC Test Strategy Based on a Non-Scan DFT Method.
Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

1997
A Partial Scan Design Method Based on n-Fold Line-up Structures.
Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1996
A Design for testability Method Using RTL Partitioning.
Proceedings of the 5th Asian Test Symposium (ATS '96), 1996

1995
Design for testability using register-transfer level partial scan selection.
Proceedings of the 1995 Conference on Asia Pacific Design Automation, Makuhari, Massa, Chiba, Japan, August 29, 1995

1993
A State Traversal Algorithm Using a State Covariance Matrix.
Proceedings of the 30th Design Automation Conference. Dallas, 1993

1985
ACTAS: an accurate timing analysis system for VLSI.
Proceedings of the 22nd ACM/IEEE conference on Design automation, 1985

1982
Logic simulation for LSI.
Proceedings of the 19th Design Automation Conference, 1982


  Loading...