Michele G. Vieira

According to our database, Michele G. Vieira authored at least 7 papers between 2005 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2008

Modeling the sensitivity of CMOS circuits to radiation induced single event transients.

Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Lima Kastensmidt

Microelectron. Reliab., 2008

2007

Accurate and computer efficient modelling of single event transients in CMOS circuits.

Gilson I. Wirth, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt

IET Circuits Devices Syst., 2007

2006

Using Bulk Built-in Current Sensors to Detect Soft Errors.

Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt

IEEE Micro, 2006

Single event transients in dynamic logic.

Gilson I. Wirth, Ivandro Ribeiro, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt

Proceedings of the 19th Annual Symposium on Integrated Circuits and Systems Design, 2006

Generation and Propagation of Single Event Transients in CMOS Circuits.

Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt

Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006

2005

Single event transients in combinatorial circuits.

Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt

Proceedings of the 18th Annual Symposium on Integrated Circuits and Systems Design, 2005

Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic.

Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt

Proceedings of the 18th Annual Symposium on Integrated Circuits and Systems Design, 2005