Michel Mermet-Guyennet

According to our database, Michel Mermet-Guyennet authored at least 17 papers between 2006 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

A 100 kW 1.2 kV 20 kHz DC-DC converter prototype based on the Dual Active Bridge topology.

Thomas Lagier, Laurent Chedot, François Wallart, Layal Ghossein, Bruno Lefebvre, Piotr Dworakowski, Michel Mermet-Guyennet, Cyril Buttay

Proceedings of the IEEE International Conference on Industrial Technology, 2018

2011

Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions.

Xavier Perpiñà, Jean-François Serviere, Jesús Urresti-Ibañez, Ignasi Cortés, Xavier Jordà, Salvador Hidalgo, José Rebollo, Michel Mermet-Guyennet

IEEE Trans. Ind. Electron., 2011

Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems.

Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, José Rebollo, Michel Mermet-Guyennet

IEEE Trans. Ind. Electron., 2011

2009

Reliability of lead-free solder in power module with stochastic uncertainty.

Alexandre Micol, Carmen Martin, Olivier Dalverny, Michel Mermet-Guyennet, Moussa Karama

Microelectron. Reliab., 2009

2008

IGBT module failure analysis in railway applications.

X. Perpiñà, Jean-François Serviere, Xavier Jordà, A. Fauquet, Salvador Hidalgo, Jesús Urresti-Ibañez, José Rebollo, Michel Mermet-Guyennet

Microelectron. Reliab., 2008

Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications.

Jean-Luc Fock Sui Too, B. Chauchat, Patrick Austin, Patrick Tounsi, Michel Mermet-Guyennet, Régis Meuret

Microelectron. Reliab., 2008

2007

Robustness test and failure analysis of IGBT modules during turn-off.

Jesús Urresti-Ibañez, Alberto Castellazzi, M. Piton, José Rebollo, Michel Mermet-Guyennet, Mauro Ciappa

Microelectron. Reliab., 2007

Virtual reliability assessment of integrated power switches based on multi-domain simulation approach.

Pierre Solomalala, J. Saiz, Michel Mermet-Guyennet, Alberto Castellazzi, Mauro Ciappa, X. Chauffleur, Jean-Pierre Fradin

Microelectron. Reliab., 2007

Local thermal cycles determination in thermosyphon-cooled traction IGBT modules reproducing mission profiles.

X. Perpiñà, M. Piton, Michel Mermet-Guyennet, Xavier Jordà, José Millán

Microelectron. Reliab., 2007

Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities.

X. Perpiñà, Alberto Castellazzi, M. Piton, Michel Mermet-Guyennet, José Millán

Microelectron. Reliab., 2007

Revisiting power cycling test for better life-time prediction in traction.

Michel Mermet-Guyennet, X. Perpiñà, M. Piton

Microelectron. Reliab., 2007

Thermal fatigue effects on the temperature distribution inside IGBT modules for zone engine aeronautical applications.

T. Lhommeau, Xavier Perpiñà, C. Martin, Régis Meuret, Michel Mermet-Guyennet, Moussa Karama

Microelectron. Reliab., 2007

A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs.

Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, M. Piton, Michel Mermet-Guyennet

Microelectron. Reliab., 2007

Measurement of the transient junction temperature in MOSFET devices under operating conditions.

Davide Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner

Microelectron. Reliab., 2007

2006

Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current.

X. Perpiñà, Jean-François Serviere, J. Saiz, Davide Barlini, Michel Mermet-Guyennet, José Millán

Microelectron. Reliab., 2006

Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications.

Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, G. Lourdel, Michel Mermet-Guyennet

Microelectron. Reliab., 2006

New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions.

Davide Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner

Microelectron. Reliab., 2006