Michal Szaj

According to our database, Michal Szaj authored at least 3 papers in 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Photonic Integrated Circuit Based Temperature Sensor for Out-of-Autoclave Composite Parts Production Monitoring.

Georgios Syriopoulos, Ioannis Poulopoulos, Charalampos Zervos, Evrydiki Kyriazi, Aggelos G. Poulimenos, Michal Szaj, Jeroen Missinne, Geert Van Steenberge, Hercules Avramopoulos

Sensors, September, 2023

NEUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS.

Fabio Pavanello, Cédric Marchand, Ian O'Connor, Régis Orobtchouk, Fabien Mandorlo, Xavier Letartre, Sébastien Cueff, Elena-Ioana Vatajelu, Giorgio Di Natale, Benoit Cluzel, Aurelien Coillet, Benoît Charbonnier, Pierre Noe, Frantisek Kavan, Martin Zoldak, Michal Szaj, Peter Bienstman, Thomas Van Vaerenbergh, Ulrich Rührmair, Paulo F. Flores, Luís Guerra e Silva, Ricardo Chaves, Luís Miguel Silveira, Mariano Ceccato, Dimitris Gizopoulos, George Papadimitriou, Vasileios Karakostas, Axel Brando, Francisco J. Cazorla, Ramon Canal, Pau Closas, Adria Gusi-Amigo, Paolo Crovetti, Alessio Carpegna, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino

CoRR, 2023

EUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS.

Fabio Pavanello, Cédric Marchand, Ian O'Connor, Régis Orobtchouk, Fabien Mandorlo, Xavier Letartre, Sébastien Cueff, Elena-Ioana Vatajelu, Giorgio Di Natale, Benoit Cluzel, Aurelien Coillet, Benoît Charbonnier, Pierre Noe, Frantisek Kavan, Martin Zoldak, Michal Szaj, Peter Bienstman, Thomas Van Vaerenbergh, Ulrich Rührmair, Paulo F. Flores, Luís Guerra e Silva, Ricardo Chaves, Luís Miguel Silveira, Mariano Ceccato, Dimitris Gizopoulos, George Papadimitriou, Vasileios Karakostas, Axel Brando, Francisco J. Cazorla, Ramon Canal, Pau Closas, Adria Gusi-Amigo, Paolo Crovetti, Alessio Carpegna, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino

Proceedings of the IEEE European Test Symposium, 2023