Michael Sekyere

According to our database, Michael Sekyere authored at least 9 papers between 2022 and 2024.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2024

Invited Paper: Low Power, Fully-Integrated Flipped Voltage Follower LDO Using Off-State Non-Linear Circuits for Enhanced Transient Performance.

Michael Sekyere, Degang Chen

Proceedings of the 67th IEEE International Midwest Symposium on Circuits and Systems, 2024

A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs.

Saeid Karimpour, Isaac Bruce, Michael Sekyere, Ruohan Yang, Emmanuel Nti Darko, Degang Chen

Proceedings of the 67th IEEE International Midwest Symposium on Circuits and Systems, 2024

Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm.

Ekaniyere Oko-Odion, Isaac Bruce, Emmanuel Nti Darko, Michael Sekyere, Degang Chen

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024

2023

Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm.

Michael Sekyere, Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen

Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm.

Isaac Bruce, Michael Sekyere, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen

Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers.

Michael Sekyere, Marampally Saikiran, Degang Chen

Proceedings of the IEEE East-West Design & Test Symposium, 2023

Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency.

Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen

Proceedings of the IEEE East-West Design & Test Symposium, 2023

Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview.

Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen

Proceedings of the IEEE East-West Design & Test Symposium, 2023

2022

All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage.

Michael Sekyere, Marampally Saikiran, Degang Chen

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022