Michael Richter

According to our database, Michael Richter authored at least 12 papers between 2007 and 2014.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2014

Test-Delivery Optimization in Manycore SOCs.

Mukesh Agrawal, Michael Richter, Krishnendu Chakrabarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Optimization of Test Pin-Count, Test Scheduling, and Test Access for NoC-Based Multicore SoCs.

Michael Richter, Krishnendu Chakrabarty

IEEE Trans. Computers, 2014

2012

Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique.

Thomas Rabenalt, Michael Richter, Frank Poehl, Michael Gössel

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

A dynamic programming solution for optimizing test delivery in multicore SOCs.

Mukesh Agrawal, Michael Richter, Krishnendu Chakrabarty

Proceedings of the 2012 IEEE International Test Conference, 2012

Test pin count reduction for NoC-based Test delivery in multicore SOCs.

Michael Richter, Krishnendu Chakrabarty

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2011

Anwendung nichtlinearer Codes zur Fehlererkennung und -korrektur.

Michael Richter

PhD thesis, 2011

2010

High Performance Compaction for Test Responses with Many Unknowns.

Thomas Rabenalt, Michael Richter, Michael Gössel

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009

X-tolerant Test Data Compaction with Accelerated Shift Registers.

Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel

J. Electron. Test., 2009

Concurrent checking with split-parity codes.

Michael Richter, Michael Gössel

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

2008

New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability.

Michael Richter, Klaus Oberländer, Michael Gössel

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

Accelerated Shift Registers for X-tolerant Test Data Compaction.

Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel

Proceedings of the 13th European Test Symposium, 2008

2007

Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques.

Andreas Leininger, Martin Fischer, Michael Richter, Michael Gössel

Proceedings of the 2007 IEEE International Test Conference, 2007