Michael Mikulla

According to our database1, Michael Mikulla authored at least 10 papers between 2004 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2024
Scaling of GaN FinFETs on 4 Inch Silicon Carbide from 20 to 150 Fins with Maximum Frequency of Oscillation fmax = 20.4 GHz.
Proceedings of the Device Research Conference, 2024

2023
Normally-off quasi-vertical GaN FinFET on SiC substrate with record small-signal current gain of $\mathrm{f}_{\mathrm{t}}=10.2$ GHz.
Proceedings of the Device Research Conference, 2023

2017
Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications.
Microelectron. Reliab., 2017

2015
Degradation of 0.25 μm GaN HEMTs under high temperature stress test.
Microelectron. Reliab., 2015

High-voltage stress time-dependent dispersion effects in AlGaN/GaN HEMTs.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014
Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices.
Microelectron. Reliab., 2014

2011
Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs.
Microelectron. Reliab., 2011

2009
Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems.
Microelectron. Reliab., 2009

2006
InP DHBT Based IC Technology for over 80 Gbit/s Data Communications.
IEICE Trans. Electron., 2006

2004
Reliability of 70 nm metamorphic HEMTs.
Microelectron. Reliab., 2004


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