Michael Meeder

According to our database, Michael Meeder authored at least 4 papers between 2005 and 2017.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2017

Determination of safe reliability region over temperature and current density for through wafer vias.

Charles S. Whitman, Michael G. Meeder, Peter J. Zampardi

Microelectron. Reliab., 2017

2014

Process reliability screening in situ.

Leslie Marchut, Michael G. Meeder, Terrence Stark

Microelectron. Reliab., 2014

2011

Application of Machine Model ESD tester to high volume capacitor reliability testing.

Michael Meeder, Leslie Marchut, Michael J. Antonell, Michael T. Fresina, Christopher E. Novak, Terry C. Darche

Microelectron. Reliab., 2011

2005

Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method.

Charles S. Whitman, Michael Meeder

Microelectron. Reliab., 2005