Michael Jin

Orcid: 0000-0002-3380-9215

According to our database1, Michael Jin authored at least 5 papers between 2022 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

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Bibliography

2024
Evaluation of Burn-in Technique on Gate Oxide Reliability in Commercial SiC MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Investigation of the Electron Trapping in Commercial Thick Silicon Dioxides Thermally Grown on 4H-SiC under the Constant Current Stress.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023
Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Learning Topological Interactions for Multi-Class Medical Image Segmentation.
Proceedings of the Computer Vision - ECCV 2022, 2022


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