Michael Jin

According to our database, Michael Jin authored at least 5 papers between 2022 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Evaluation of Burn-in Technique on Gate Oxide Reliability in Commercial SiC MOSFETs.

Limeng Shi, Jiashu Qian, Michael Jin, Monikuntala Bhattacharya, Hengyu Yu, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Investigation of the Electron Trapping in Commercial Thick Silicon Dioxides Thermally Grown on 4H-SiC under the Constant Current Stress.

Jiashu Qian, Limeng Shi, Michael Jin, Monikuntala Bhattacharya, Hengyu Yu, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori, Tianshi Liu, Shengnan Zhu

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs.

Shengnan Zhu, Limeng Shi, Michael Jin, Jiashu Qian, Monikuntala Bhattacharya, Hema Lata Rao Maddi, Marvin H. White, Anant K. Agarwal, Tianshi Liu, Atsushi Shimbori, Chingchi Chen

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs.

Limeng Shi, Shengnan Zhu, Jiashu Qian, Michael Jin, Monikuntala Bhattacharya, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori, Tianshi Liu

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Learning Topological Interactions for Multi-Class Medical Image Segmentation.

Saumya Gupta, Xiaoling Hu, James Kaan, Michael Jin, Mutshipay Mpoy, Katherine Chung, Gagandeep Singh, Mary M. Saltz, Tahsin M. Kurç, Joel H. Saltz, Apostolos Tassiopoulos, Prateek Prasanna, Chao Chen

Proceedings of the Computer Vision - ECCV 2022, 2022