Michael J. Uren
Orcid: 0000-0002-8842-0426
According to our database1,
Michael J. Uren
authored at least 14 papers
between 1998 and 2023.
Collaborative distances:
Collaborative distances:
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Bibliography
2023
Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2020
Current collapse and kink effect in GaN RF HEMTs: the key role of the epitaxial buffer.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2020
2018
Microelectron. Reliab., 2018
2017
Morphological and electrical comparison of Ti and Ta based ohmic contacts for AlGaN/GaN-on-SiC HFETs.
Microelectron. Reliab., 2017
Temperature dependent substrate trapping in AlGaN/GaN power devices and the impact on dynamic ron.
Proceedings of the 47th European Solid-State Device Research Conference, 2017
2015
Microelectron. Reliab., 2015
Study of hot electrons in AlGaN/GaN HEMTs under RF Class B and Class J operation using electroluminescence.
Microelectron. Reliab., 2015
2014
Implications of gate-edge electric field in AlGaN/GaN high electron mobility transistors during OFF-state degradation.
Microelectron. Reliab., 2014
Liquid crystal electrography: Electric field mapping and detection of peak electric field strength in AlGaN/GaN high electron mobility transistors.
Microelectron. Reliab., 2014
2012
Microelectron. Reliab., 2012
2003
Low frequency drain noise comparison of AlGaN/GaN HEMT's grown on silicon, SiC and sapphire substrates.
Microelectron. Reliab., 2003
2001
A physically based compact model of partially depleted SOI MOSFETs for analog circuit simulation.
IEEE J. Solid State Circuits, 2001
1999
A multibit ΣΔ modulator in floating-body SOS/SOI CMOS for extreme radiation environments.
IEEE J. Solid State Circuits, 1999
1998
IEEE J. Solid State Circuits, 1998