Michael Heer

According to our database, Michael Heer authored at least 9 papers between 2004 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique.

Matteo Rigato, Clément Fleury, Michael Heer, Mattia Capriotti, Werner Simbürger, Dionyz Pogany

Microelectron. Reliab., 2015

2011

Application of transient interferometric mapping method for ESD and latch-up analysis.

Dionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik

Microelectron. Reliab., 2011

2009

Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology.

Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler

Microelectron. Reliab., 2009

Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.

Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany

Microelectron. Reliab., 2009

2008

Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications.

Michael Heer, P. Grombach, A. Heid, Dionyz Pogany

Microelectron. Reliab., 2008

2007

Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices.

Michael Heer, Sergey Bychikhin, W. Mamanee, Dionyz Pogany, A. Heid, P. Grombach, M. Klaussner, Winfried Soppa, Bernd Ramler

Microelectron. Reliab., 2007

2006

Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.

Michael Heer, Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Frank, A. Konrad, J. Schulz

Microelectron. Reliab., 2006

2005

Automated setup for thermal imaging and electrical degradation study of power DMOS devices.

Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos

Microelectron. Reliab., 2005

2004

Multiple-time-instant 2D thermal mapping during a single ESD event.

Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik

Microelectron. Reliab., 2004