Michael G. Wahl

According to our database, Michael G. Wahl authored at least 16 papers between 1989 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Branch selection and data optimization for selecting machines for processes in semiconductor manufacturing using AI-based predictions.

Peter Stich, Rebecca Busch, Michael G. Wahl, Christian Weber, Madjid Fathi

Proceedings of the IEEE International Conference on Electro Information Technology, 2021

2020

Yield prediction in semiconductor manufacturing using an AI-based cascading classification system.

Peter Stich, Michael G. Wahl, Peter Czerner, Christian Weber, Madjid Fathi

Proceedings of the 2020 IEEE International Conference on Electro Information Technology, 2020

2019

AAT Meets Virtual Reality.

Tanja Joan Eiler, Armin Grünewald, Michael G. Wahl, Rainer Brück

Proceedings of the Computer Vision, Imaging and Computer Graphics Theory and Applications, 2019

2015

Cost modeling and analysis for the design, manufacturing and test of 3D-ICs.

Armin Grünewald, Michael G. Wahl, Rainer Brück

Proceedings of the 2015 International 3D Systems Integration Conference, 2015

2014

Site dependencies in a multisite testing environment.

Thomas Lehner, Andreas Kuhr, Michael G. Wahl, Rainer Brück

Proceedings of the 19th IEEE European Test Symposium, 2014

Startup error detection and containment to improve the robustness of hybrid FlexRay networks.

Alexander Kordes, Bart Vermeulen, Abhijit K. Deb, Michael G. Wahl

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Manufacturing and test assistance for 3D-Integrated heterogeneous systems.

Armin Grünewald, Michael G. Wahl, Rainer Brück

Proceedings of the 2014 International 3D Systems Integration Conference, 2014

2007

A sophisticated memory test engine for LCD display drivers.

Oliver Spang, Hans Martin von Staudt, Michael G. Wahl

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2003

The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data.

Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2001

From DFT to systems test - a model based cost optimization tool.

Michael G. Wahl, Anthony P. Ambler, Christoph Maaß, Mohammed Rahman

Proceedings of the Conference on Design, Automation and Test in Europe, 2001

1998

A VHDL SGRAM Model for the Validation Environment of a High Performance Graphic Processor.

Michael G. Wahl, Holger Völkel

Proceedings of the 1998 Design, 1998

A Systematic Analysis of Reuse Strategies for Design of Electronic Circuits.

Manfred Koegst, Dieter Garte, Peter Conradi, Michael G. Wahl

Proceedings of the 1998 Design, 1998

1997

Introducing multimedia in teaching of digital system design.

Peter Conradi, Ulrich Heinkel, Michael G. Wahl

Proceedings of the 1997 IEEE International Conference on Microelectronic Systems Education, 1997

1992

EDIF Test - The Upcoming Standard for Test Data Transfers.

Michael G. Wahl, Carol Pyron

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1990

Development of a new standard for test.

William W. Sebesta, Bas Verhelst, Michael G. Wahl

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1989

Data exchange formats for testing.

Johannes Pfeifer, Michael G. Wahl, Hans Wojtkowiak

Microprocessing and Microprogramming, 1989