Michael G. Dimopoulos

Orcid: 0000-0002-5475-2887

Affiliations:
  • IMAG, Grenoble, France


According to our database1, Michael G. Dimopoulos authored at least 26 papers between 2002 and 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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Bibliography

2021
The Quest of the Ideal Error Detecting Architecture: The GRAAL Architecture.
IEEE Trans. Sustain. Comput., 2021

2016
Advanced double-sampling architectures.
Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

2014
Fault-tolerant adaptive routing under an unconstrained set of node and link failures for many-core systems-on-chip.
Microprocess. Microsystems, 2014

2013
Closed-form expressions for the coupling capacitance of metal fill tiles in VLSI circuits.
Microelectron. J., 2013

Exact closed-form expressions for substrate resistance and capacitance extraction in nanoscale VLSI.
Microelectron. J., 2013

Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip.
Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

2011
Wavelet Analysis for the Detection of Parametric and Catastrophic Faults in Mixed-Signal Circuits.
IEEE Trans. Instrum. Meas., 2011

A Nondestructive Method for Accurately Extracting Substrate Parameters of Arbitrary Doping Profile in Nanoscale VLSI.
IEEE Trans. Instrum. Meas., 2011

An evolutionary method for efficient computation of mutual capacitance for VLSI circuits based on the method of images.
Simul. Model. Pract. Theory, 2011

Prospects of 3D inductors on through silicon vias processes for 3D ICs.
Proceedings of the IEEE/IFIP 19th International Conference on VLSI and System-on-Chip, 2011

Efficient inductance calculation for long and medium length rectangular interconnects in VLSI circuits.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2011), 2011

A memetic algorithm for computing 3D capacitance in multiconductor VLSI circuits.
Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

2010
Circuit Implementation of a Supply Current Spectrum Test Method.
IEEE Trans. Instrum. Meas., 2010

Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets.
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2010

Wavelet analysis of current measurements for mixed-signal circuit testing.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits.
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

Efficient testing of an optical feedback pixel driver using wavelet analysis.
Proceedings of the 17th IEEE International Conference on Electronics, 2010

A GA-based method for efficient interconnect capacitance computation in mixed-signal integrated circuits using sets of linear charges.
Proceedings of the 17th IEEE International Conference on Electronics, 2010

2008
Power supply current testing in the production line of emergency luminaire circuits.
Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008

Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach.
Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008

2007
Multiple Parametric Circuit Analysis Tool for Detectability Estimation.
Proceedings of the 14th IEEE International Conference on Electronics, 2007

Design and development of a versatile testing system for analog and mixed-signal circuits.
Proceedings of the 18th European Conference on Circuit Theory and Design, 2007

2004
Μέθοδοι ελέγχου ολοκληρωμένων ψηφιακών κυκλωμάτων
PhD thesis, 2004

Efficient Static Compaction of Test Sequence Sets through the Application of Set Covering Techniques.
Proceedings of the 2004 Design, 2004

2003
Accelerating the compaction of test sequences in sequential circuits through problem size reduction.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003

2002
Using Non-uniform Crossover in Genetic Algorithm Methods to Speed up the Generation of Test Patterns for Sequential Circuits.
Proceedings of the Methods and Applications of Artificial Intelligence, 2002


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