Miao Tony He

According to our database, Miao Tony He authored at least 10 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Deep Fair Partition for Hyperspectral Image Classification.

Miao Tony He, Fangfang Xia, Rick L. Stevens

Proceedings of the 13th Workshop on Hyperspectral Imaging and Signal Processing: Evolution in Remote Sensing, 2023

2020

SCRIPT: A CAD Framework for Power Side-channel Vulnerability Assessment Using Information Flow Tracking and Pattern Generation.

Adib Nahiyan, Jungmin Park, Miao Tony He, Yousef Iskander, Farimah Farahmandi, Domenic Forte, Mark M. Tehranipoor

ACM Trans. Design Autom. Electr. Syst., 2020

2019

RTL-PSC: Automated Power Side-Channel Leakage Assessment at Register-Transfer Level.

Miao Tony He, Jungmin Park, Adib Nahiyan, Apostol Vassilev, Yier Jin, Mark M. Tehranipoor

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

2018

Secure Scan and Test Using Obfuscation Throughout Supply Chain.

Xiaoxiao Wang, Dongrong Zhang, Miao Tony He, Donglin Su, Mark M. Tehranipoor

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

2017

Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications.

Miao Tony He, Gustavo K. Contreras, Dat Tran, LeRoy Winemberg, Mark M. Tehranipoor

IEEE Trans. Very Large Scale Integr. Syst., 2017

Benchmarking of Hardware Trojans and Maliciously Affected Circuits.

Bicky Shakya, Miao Tony He, Hassan Salmani, Domenic Forte, Swarup Bhunia, Mark M. Tehranipoor

J. Hardw. Syst. Secur., 2017

An Access Mechanism for Embedded Sensors in Modern SoCs.

Miao Tony He, Mark M. Tehranipoor

J. Electron. Test., 2017

Dynamically obfuscated scan for protecting IPs against scan-based attacks throughout supply chain.

Dongrong Zhang, Miao Tony He, Xiaoxiao Wang, Mark M. Tehranipoor

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

2016

Test-point insertion efficiency analysis for LBIST applications.

Miao Tony He, Gustavo K. Contreras, Mark M. Tehranipoor, Dat Tran, LeRoy Winemberg

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2014

SAM: A comprehensive mechanism for accessing embedded sensors in modern SoCs.

Miao Tony He, Mohammad Tehranipoor

Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014