Meryem Marzouki

According to our database1, Meryem Marzouki authored at least 14 papers between 1991 and 2007.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2007
Identity control, activity control: from trust to suspicion.
Ann. des Télécommunications, 2007

2002
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing.
J. Electron. Test., 2002

2001
Cost/Quality Trade-off in Synthesis for BIST.
J. Electron. Test., 2001

Testing TAPed cores and wrapped cores with the same test access mechanism.
Proceedings of the Conference on Design, Automation and Test in Europe, 2001

2000
Solving the I/O Bandwidth Problem in System on a Chip Testing.
Proceedings of the 13th Annual Symposium on Integrated Circuits and Systems Design, 2000

CAS-BUS: A Scalable and Reconfigurable Test Access Mechanism for Systems on a Chip.
Proceedings of the 2000 Design, 2000

1997
Hardware Test: Can We Learn from Software Testing?
Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

1996
Test and diagnosis of analog circuits: When fuzziness can lead to accuracy.
J. Electron. Test., 1996

System Fault Diagnosis based on a Fuzzy Qualitative Approach.
Proceedings of the 1996 European Design and Test Conference, 1996

FLAMES: A Fuzzy Logic ATMS and Model-based Expert System for Analog Diagnosis.
Proceedings of the 1996 European Design and Test Conference, 1996

A Pragmatic, Systematic And Flexible Synthesis For Testability Methodology.
Proceedings of the 5th Asian Test Symposium (ATS '96), 1996

1993
Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards.
Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993

1991
Approches a base de connaissances pour le test de circuits VLSI : application à la validation de prototypes dans le cadre d'un test sans contact. (Knowledge-based approaches to VLSI circuit testing : application to prototype validation by contactless testing).
PhD thesis, 1991

Model-based reasoning for electron-beam debugging of VLSI circuits.
J. Electron. Test., 1991


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