Meng Zhang
Orcid: 0000-0002-6992-3722Affiliations:
- Huazhong University of Science and Technology, Wuhan National Laboratory for Optoelectronics, China
According to our database1,
Meng Zhang
authored at least 29 papers
between 2015 and 2023.
Collaborative distances:
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Bibliography
2023
Exploiting the Single-Symbol LLR Variation to Accelerate LDPC Decoding for 3-D nand Flash Memory.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., December, 2023
High-Precision Short-Term Lifetime Prediction in TLC 3-D NAND Flash Memory as Hot-Data Storage.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., June, 2023
IEEE Trans. Consumer Electron., February, 2023
ALCod: Adaptive LDPC Coding for 3-D NAND Flash Memory Using Inter-Layer RBER Variation.
IEEE Trans. Consumer Electron., 2023
2022
Characterization Summary of Performance, Reliability, and Threshold Voltage Distribution of 3D Charge-Trap NAND Flash Memory.
ACM Trans. Storage, 2022
Improving LDPC Decoding Performance for 3D TLC NAND Flash by LLR Optimization Scheme for Hard and Soft Decision.
ACM Trans. Design Autom. Electr. Syst., 2022
Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
Work-in-Progress: High-Precision Short-Term Lifetime Prediction in TLC 3D NAND Flash Memory as Hot-data Storage.
Proceedings of the International Conference on Compilers, 2022
2021
DEPS: Exploiting a Dynamic Error Prechecking Scheme to Improve the Read Performance of SSD.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021
J. Comput. Sci. Technol., 2021
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021
2020
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020
2019
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019
IEEE Access, 2019
Proceedings of the 34th ACM/SIGAPP Symposium on Applied Computing, 2019
VaLLR: Threshold Voltage Distribution Aware LLR Optimization to Improve LDPC Decoding Performance for 3D TLC NAND Flash.
Proceedings of the 37th IEEE International Conference on Computer Design, 2019
Characterizing the Reliability and Threshold Voltage Shifting of 3D Charge Trap NAND Flash.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019
Adapting Layer RBERs Variations of 3D Flash Memories via Multi-granularity Progressive LDPC Reading.
Proceedings of the 56th Annual Design Automation Conference 2019, 2019
2018
IEEE Access, 2018
2017
A Program Interference Error Aware LDPC Scheme for Improving NAND Flash Decoding Performance.
ACM Trans. Embed. Comput. Syst., 2017
Proceedings of the IEEE 6th Non-Volatile Memory Systems and Applications Symposium, 2017
CooECC: A Cooperative Error Correction Scheme to Reduce LDPC Decoding Latency in NAND Flash.
Proceedings of the 2017 IEEE International Conference on Computer Design, 2017
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017
2016
REAL: A retention error aware LDPC decoding scheme to improve NAND flash read performance.
Proceedings of the 32nd Symposium on Mass Storage Systems and Technologies, 2016
2015
A novel optimization algorithm for Chien search of BCH Codes in NAND flash memory devices.
Proceedings of the 10th IEEE International Conference on Networking, 2015