Melanie Po-Leen Ooi
Orcid: 0000-0002-1623-0105
According to our database1,
Melanie Po-Leen Ooi
authored at least 71 papers
between 2005 and 2024.
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Bibliography
2024
Hyperspectral Imaging and Machine Learning to Identify Epicuticular Wax Loss in Masena Blueberries for Post-Harvest Freshness.
Proceedings of the 20th IEEE International Conference on Automation Science and Engineering, 2024
2023
Measurement and Applications: Exploring the Challenges and Opportunities of Hierarchical Federated Learning in Sensor Applications.
IEEE Instrum. Meas. Mag., December, 2023
IEEE Internet Comput., 2023
On machine learning methods to estimate cannabidiolic acid content of Cannabis sativa L. from near-infrared hyperspectral imaging.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2023
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2023
Keep It Simple: Fault Tolerance Evaluation of Federated Learning with Unreliable Clients.
Proceedings of the 16th IEEE International Conference on Cloud Computing, 2023
2022
IEEE Trans. Instrum. Meas., 2022
IEEE Instrum. Meas. Mag., 2022
Proceedings of the IEEE International Conference on Services Computing, 2022
2021
IEEE Access, 2021
Investigating the Use of Low-cost and Low-power Millimeter Wave RADAR to Improve Quality of Tomato Harvesting.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2021
Method and Implementation of Rock Melon Detection and Localisation for Fast and Reliable Autonomous Harvesting.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2021
2020
Future trends in I&M: The next generation of measurement technology for medicinal cannabis production.
IEEE Instrum. Meas. Mag., 2020
Classifying Cannabis Sativa Flowers, Stems and Leaves using Statistical Machine Learning with Near-Infrared Hyperspectral Reflectance Imaging.
Proceedings of the 2020 IEEE International Instrumentation and Measurement Technology Conference, 2020
Signal-to-Noise Ratio Contributors and Effects in Proximal Near-Infrared Spectral Reflectance Measurement on Plant Leaves.
Proceedings of the 2020 IEEE International Instrumentation and Measurement Technology Conference, 2020
Logic Built-In Self-Test Instrumentation System for Engineering Test Technology Education.
Proceedings of the 2020 IEEE International Instrumentation and Measurement Technology Conference, 2020
2019
IEEE Instrum. Meas. Mag., 2019
IEEE Instrum. Meas. Mag., 2019
Evaluation of Deep Neural Network and Alternating Decision Tree for Kiwifruit Detection.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019
Proximal Near-Infrared Spectral Reflectance Characterisation of Weeds Species in New Zealand Pasture.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019
Addressing Emerging Needs of Hi-Tech Industry: Collaborative Engineering Program in Electronic Testing, Instrumentation and Measurement.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019
Developing Automatic Markerless Sign Language Gesture Tracking and Recognition System.
Proceedings of the 2019 IEEE International Symposium on Haptic, 2019
2018
IEEE Instrum. Meas. Mag., 2018
IEEE Instrum. Meas. Mag., 2018
Automated quantification of renal interstitial fibrosis for computer-aided diagnosis: A comprehensive tissue structure segmentation method.
Comput. Methods Programs Biomed., 2018
IEEE Access, 2018
Towards implementing uncertainty propagation in probabilistic floating-point computation error bounding.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018
Application of moment-based measurement uncertainty evaluation to reliability analysis of structural systems.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018
2017
IEEE Trans. Instrum. Meas., 2017
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017
Moments and maximum entropy method for expanded uncertainty estimation in measurements.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017
Proceedings of the IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, 2017
Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education.
Proceedings of the IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, 2017
2016
IEEE Trans. Instrum. Meas., 2016
IEEE Instrum. Meas. Mag., 2016
IEEE Instrum. Meas. Mag., 2016
Automating measurement of renal interstitial fibrosis: Effect of colour spaces on quantification.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2016
Moment-based measurement uncertainty evaluation for reliability analysis in design optimization.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2016
2015
Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015
Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015
2014
Fast and robust zebrafish segmentation and detection algorithm under different spectrum conditions.
Proceedings of the IEEE Sensors Applications Symposium, 2014
Proceedings of the IEEE Sensors Applications Symposium, 2014
Proceedings of the IEEE Sensors Applications Symposium, 2014
Detecting spongiosis in stained histopathological specimen using multispectral imaging and machine learning.
Proceedings of the IEEE Sensors Applications Symposium, 2014
2013
Eng. Appl. Artif. Intell., 2013
IEEE Des. Test, 2013
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013
2012
IEEE Trans. Instrum. Meas., 2012
Comput. Stat. Data Anal., 2012
2011
Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction.
IEEE Trans. Instrum. Meas., 2011
IEEE Trans. Instrum. Meas., 2011
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011
Data-Driven Condition-Based Maintenance of Test Handlers in Semiconductor Manufacturing.
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011
Proceedings of the Sixth IEEE International Symposium on Electronic Design, 2011
2010
Int. J. Intell. Syst. Technol. Appl., 2010
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010
Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010
2009
Int. J. Intell. Syst. Technol. Appl., 2009
2008
Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008
2007
IEEE Trans. Instrum. Meas., 2007
2006
Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis.
IEEE Des. Test Comput., 2006
Hardware Implementation for Face Detection on Xilinx Virtex-II FPGA using the Reversible Component Transformation Colour Space.
Proceedings of the Third IEEE International Workshop on Electronic Design, 2006
2005
Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST.
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005