Meisam Lavasani
According to our database1,
Meisam Lavasani
authored at least 3 papers
between 2002 and 2004.
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Bibliography
2004
Using RT Level Component Descriptions for Single Stuck-at Hierarchical Fault Simulation.
J. Electron. Test., 2004
Proceedings of the 2004 Symposium on Applications and the Internet (SAINT 2004), 2004
2002
Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002