Mehdi Dehbashi

According to our database, Mehdi Dehbashi authored at least 18 papers between 2007 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2018

Constraint-Based Pattern Retargeting for Reducing Localized Power Activity During Testing.

Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler, Mehdi Dehbashi, Ulrike Pfannkuchen

Proceedings of the 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2018

2017

Machine learning based test pattern analysis for localizing critical power activity areas.

Harshad Dhotre, Stephan Eggersglüß, Mehdi Dehbashi, Ulrike Pfannkuchen, Rolf Drechsler

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017

2016

Automated Optimization of Scan Chain Structure for Test Compression-Based Designs.

Harshad Dhotre, Mehdi Dehbashi, Ulrike Pfannkuchen, Klaus Hofmann

Proceedings of the 25th IEEE Asian Test Symposium, 2016

2015

Transaction-based online debug for NoC-based multiprocessor SoCs.

Mehdi Dehbashi, Görschwin Fey

Microprocess. Microsystems, 2015

2014

Debug Automation for Synchronization Bugs at RTL.

Mehdi Dehbashi, Görschwin Fey

Proceedings of the 2014 27th International Conference on VLSI Design, 2014

Automated formal verification of X propagation with respect to testability issues.

Mehdi Dehbashi, Daniel Tille, Ulrike Pfannkuchen, Stephan Eggersglüß

Proceedings of the 9th International Design and Test Symposium, 2014

SAT-based speedpath debugging using X traces.

Mehdi Dehbashi, Görschwin Fey

Proceedings of the 9th International Design and Test Symposium, 2014

Sat-based speedpath debugging using waveforms.

Mehdi Dehbashi, Görschwin Fey

Proceedings of the 19th IEEE European Test Symposium, 2014

2013

Debug automation from pre-silicon to post-silicon.

Mehdi Dehbashi

PhD thesis, 2013

Automated design debugging in a testbench-based verification environment.

Mehdi Dehbashi, André Sülflow, Görschwin Fey

Microprocess. Microsystems, 2013

Debug Automation for Logic Circuits Under Timing Variations.

Mehdi Dehbashi, Görschwin Fey

IEEE Des. Test, 2013

Efficient automated speedpath debugging.

Mehdi Dehbashi, Görschwin Fey

Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

2012

Functional analysis of circuits under timing variations.

Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan

Proceedings of the 17th IEEE European Test Symposium, 2012

On Modeling and Evaluation of Logic Circuits under Timing Variations.

Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan

Proceedings of the 15th Euromicro Conference on Digital System Design, 2012

Automated debugging from pre-silicon to post-silicon.

Mehdi Dehbashi, Görschwin Fey

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

Automated Post-Silicon Debugging of Failing Speedpaths.

Mehdi Dehbashi, Görschwin Fey

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2008

Fault Effects in FlexRay-Based Networks with Hybrid Topology.

Mehdi Dehbashi, Vahid Lari, Seyed Ghassem Miremadi, Mohammad Shokrollah-Shirazi

Proceedings of the The Third International Conference on Availability, 2008

2007

Assessment of Message Missing Failures in FlexRay-Based Networks.

Vahid Lari, Mehdi Dehbashi, Seyed Ghassem Miremadi, Navid Farazmand

Proceedings of the 13th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2007), 2007