Md Toufiq Hasan Anik
Orcid: 0000-0001-9302-413X
According to our database1,
Md Toufiq Hasan Anik
authored at least 13 papers
between 2020 and 2024.
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Timeline
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2024
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Book In proceedings Article PhD thesis Dataset OtherLinks
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Bibliography
2024
J. Electron. Test., December, 2024
On the Resiliency of Protected Masked S-Boxes Against Template Attack in the Presence of Temperature and Aging Misalignments.
IEEE Trans. Very Large Scale Integr. Syst., May, 2024
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024
2023
Proceedings of the Great Lakes Symposium on VLSI 2023, 2023
2021
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021
J. Electron. Test., 2021
IEEE Access, 2021
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2021
Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021
On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits.
Proceedings of the ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, 2021
2020
Proceedings of the 33rd International Conference on VLSI Design and 19th International Conference on Embedded Systems, 2020
On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability.
Proceedings of the 38th IEEE International Conference on Computer Design, 2020
Proceedings of the IEEE European Test Symposium, 2020