Mauro J. Kobrinsky
According to our database1,
Mauro J. Kobrinsky
authored at least 5 papers
between 2014 and 2023.
Collaborative distances:
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On csauthors.net:
Bibliography
2023
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
Novel Cell Architectures with Back-side Transistor Contacts for Scaling and Performance.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
2021
Back End Of Line opportunities and reliability challenges for future technology nodes.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2015
Wafer-level electromigration for reliability monitoring: Quick-turn electromigration stress with correlation to package-level stress.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
2014
Proceedings of the Optical Fiber Communications Conference and Exhibition, 2014