Mauro Bonanomi

According to our database, Mauro Bonanomi authored at least 4 papers between 2005 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Based Ferroelectric NVDRAM.

Devanarayanan Ettisserry, Angelo Visconti, Mauro Bonanomi, Riccardo Pazzocco, Andrea Locatelli, Alessandro Sebastiani, Ashonita Chavan, Matthew Hollander, Giorgio Servalli, Alessandro Calderoni, Nirmal Ramaswamy

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2010

Impact of total dose on heavy-ion upsets in floating gate arrays.

Simone Gerardin, Marta Bagatin, Alessandro Paccagnella, G. Cellere, Angelo Visconti, Mauro Bonanomi

Microelectron. Reliab., 2010

2006

Erratic Effects of Irradiation in Floating Gate Memory Cells.

G. Cellere, Alessandro Paccagnella, Angelo Visconti, Mauro Bonanomi

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

2005

Soft Errors induced by single heavy ions in Floating Gate memory arrays.

G. Cellere, Alessandro Paccagnella, Angelo Visconti, Mauro Bonanomi

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005