Maurizio Rebaudengo

IEEE Internet Things J., September, 2024

2022

Analyzing In-Memory NoSQL Landscape.

[BibT_eX]

[DOI]

Mohammad Sadoghi

IEEE Trans. Knowl. Data Eng., 2022

Reliability assessment of FreeRTOS in Embedded Systems.

[BibT_eX]

[DOI]

Alberto Bosio

Gennaro Severino Rodrigues

Alessandro Savino

Proceedings of the 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, 2022

Toward the hardening of real-time operating systems.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

Special Session: Operating Systems under test: an overview of the significance of the operating system in the resiliency of the computing continuum.

[BibT_eX]

[DOI]

Emmanuel Casseau

Petr Dobiás

Oliver Sinnen

Fernanda Lima Kastensmidt

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Detection of Contaminated Hazelnuts under UV Illumination.

[BibT_eX]

[DOI]

Sorath Asnani

Proceedings of the ICIGP 2021: The 4th International Conference on Image and Graphics Processing, Sanya, China, 1, 2021

Analyzing In-Memory NoSQL Landscape (Extended Abstract).

[BibT_eX]

[DOI]

Mohammad Sadoghi

Proceedings of the 37th IEEE International Conference on Data Engineering, 2021

Low-cost PM Sensor Behaviour Based on Duty-Cycle Analysis.

[BibT_eX]

[DOI]

Gustavo Ramirez Espinosa

Edoardo Giusto

Proceedings of the 26th IEEE International Conference on Emerging Technologies and Factory Automation, 2021

2020

Transitory Master Key Transport Layer Security for WSNs.

[BibT_eX]

[DOI]

Mattia Griotti

IEEE Access, 2020

On the Analysis of Real-time Operating System Reliability in Embedded Systems.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2019

A Review on Fall Prediction and Prevention System for Personal Devices: Evaluation and Experimental Results.

[BibT_eX]

[DOI]

Adv. Hum. Comput. Interact., 2019

Personal Assistance and Monitoring Devices Applications.

[BibT_eX]

[DOI]

Francisca Rosique

Adv. Hum. Comput. Interact., 2019

A Fuzzy Approach for Reducing Power Consumption in Wireless Sensor Networks: A Testbed With IEEE 802.15.4 and WirelessHART.

[BibT_eX]

[DOI]

Mario Collotta

IEEE Access, 2019

2018

Internet of Things for fall prediction and prevention.

[BibT_eX]

[DOI]

J. Comput. Methods Sci. Eng., 2018

A cost-effective proposal for an RFID-based system for agri-food traceability.

[BibT_eX]

[DOI]

Int. J. Ad Hoc Ubiquitous Comput., 2018

Redundancy in Key Management for WSNs.

[BibT_eX]

[DOI]

Cryptogr., 2018

A fuzzy approach for power savings in both infrastructure and ad hoc WLANs.

[BibT_eX]

[DOI]

Mario Collotta

Comput. Ind., 2018

A dense RFID network for flexible Thermal Monitoring.

[BibT_eX]

[DOI]

Proceedings of the 6th International EURASIP Workshop on RFID Technology, 2018

Particulate Matter Monitoring in Mixed Indoor/Outdoor Industrial Applications: A Case Study.

[BibT_eX]

[DOI]

Edoardo Giusto

Mingyang Zhang

Proceedings of the 23rd IEEE International Conference on Emerging Technologies and Factory Automation, 2018

2017

A Key Distribution Scheme for Mobile Wireless Sensor Networks: q-Composite.

[BibT_eX]

[DOI]

IEEE Trans. Inf. Forensics Secur., 2017

A security protocol for RFID traceability.

[BibT_eX]

[DOI]

Int. J. Commun. Syst., 2017

TMR technique for mutex kernel data structures.

[BibT_eX]

[DOI]

Alejandro David Velasco

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

Mixed public and secret-key cryptography for wireless sensor networks.

[BibT_eX]

[DOI]

Mattia Griotti

Proceedings of the Tenth International Conference on Mobile Computing and Ubiquitous Network, 2017

Urban dust monitoring from ground level to last floor.

[BibT_eX]

[DOI]

Proceedings of the Tenth International Conference on Mobile Computing and Ubiquitous Network, 2017

Polynomial classification model for real-time fall prediction system.

[BibT_eX]

[DOI]

Milad Karimshoushtari

Carlo Novara

Proceedings of the 41st IEEE Annual Computer Software and Applications Conference, 2017

DIIG: A Distributed Industrial IoT Gateway.

[BibT_eX]

[DOI]

Mohammad Ghazivakili

Proceedings of the 41st IEEE Annual Computer Software and Applications Conference, 2017

2016

Investigation of Interference Models for RFID Systems.

[BibT_eX]

[DOI]

Sensors, 2016

A Mobile and Low-Cost System for Environmental Monitoring: A Case Study.

[BibT_eX]

[DOI]

Sensors, 2016

KITO tool: A fault injection environment in Linux kernel data structures.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2016

Fast Hierarchical Key Management Scheme With Transitory Master Key for Wireless Sensor Networks.

[BibT_eX]

[DOI]

IEEE Internet Things J., 2016

A Neural Network Model Based on Co-occurrence Matrix for Fall Prediction.

[BibT_eX]

[DOI]

Proceedings of the Wireless Mobile Communication and Healthcare, 2016

Kanzi: A Distributed, In-memory Key-Value Store.

[BibT_eX]

[DOI]

Mohammad Sadoghi

Proceedings of the Posters and Demos Session of the 17th International Middleware Conference, 2016

Exploiting accelerometers to estimate displacement.

[BibT_eX]

[DOI]

Proceedings of the 5th Mediterranean Conference on Embedded Computing, 2016

2015

On gait recognition with smartphone accelerometer.

[BibT_eX]

[DOI]

Imane Benkhelifa

Proceedings of the 4th Mediterranean Conference on Embedded Computing, 2015

An innovative parallel fuzzy scheme for low-power consumption in IEEE 802.11 devices.

[BibT_eX]

[DOI]

Proceedings of the 13th IEEE International Conference on Industrial Informatics, 2015

A novel simulator for RFID reader-to-reader anti-collision protocols.

[BibT_eX]

[DOI]

Proceedings of the 2015 International EURASIP Workshop on RFID Technology, 2015

Experimental investigation on the interference between UHF RFID and GSM.

[BibT_eX]

[DOI]

Proceedings of the 2015 International EURASIP Workshop on RFID Technology, 2015

2014

Improving Colorwave with the probabilistic approach for reader-to-reader anti-collision TDMA protocols.

[BibT_eX]

[DOI]

Wirel. Networks, 2014

Key Management for Static Wireless Sensor Networks With Node Adding.

[BibT_eX]

[DOI]

IEEE Trans. Ind. Informatics, 2014

Performance analysis of reliable flooding in duty-cycle wireless sensor networks.

[BibT_eX]

[DOI]

Trans. Emerg. Telecommun. Technol., 2014

Software-implemented fault injection in operating system kernel mutex data structure.

[BibT_eX]

[DOI]

Alejandro David Velasco

Proceedings of the IEEE 5th Latin American Symposium on Circuits and Systems, 2014

A parallel fuzzy scheme to improve power consumption management in Wireless Sensor Networks.

[BibT_eX]

[DOI]

Proceedings of the 2014 IEEE Emerging Technology and Factory Automation, 2014

Fault injection in the process descriptor of a Unix-based operating system.

[BibT_eX]

[DOI]

Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014

2013

DCNS: An Adaptable High Throughput RFID Reader-to-Reader Anticollision Protocol.

[BibT_eX]

[DOI]

M. Victoria Bueno-Delgado

IEEE Trans. Parallel Distributed Syst., 2013

A Geometric Distribution Reader Anti-Collision Protocol for RFID Dense Reader Environments.

[BibT_eX]

[DOI]

IEEE Trans Autom. Sci. Eng., 2013

Evaluation of single and additive interference models for RFID collisions.

[BibT_eX]

[DOI]

Math. Comput. Model., 2013

Trade-off between maximum cardinality of collision sets and accuracy of RFID reader-to-reader collision detection.

[BibT_eX]

[DOI]

EURASIP J. Embed. Syst., 2013

Improving Key Negotiation in Transitory Master Key Schemes for Wireless Sensor Networks.

[BibT_eX]

[DOI]

Cesare Celozzi

Proceedings of the Sensor Systems and Software - 4th International ICST Conference, 2013

Simulation and Evaluation of the Interference Models for RFID Reader-to-Reader Collisions.

[BibT_eX]

[DOI]

Proceedings of the 11th International Conference on Advances in Mobile Computing & Multimedia, 2013

Hierarchical Key Negotiation Technique for Transitory Master Key Schemes in Wireless Sensor Networks.

[BibT_eX]

[DOI]

Cesare Celozzi

Proceedings of the 2013 Eighth International Conference on Broadband and Wireless Computing, 2013

Simulating Reader-to-Reader Interference in RFID Systems.

[BibT_eX]

[DOI]

Proceedings of the 27th International Conference on Advanced Information Networking and Applications Workshops, 2013

2012

A Fair and High Throughput Reader-to-Reader Anticollision Protocol in Dense RFID Networks.

[BibT_eX]

[DOI]

IEEE Trans. Ind. Informatics, 2012

A Comparison between Single and Additive Contribution in RFID Reader-to-Reader Interference Models.

[BibT_eX]

[DOI]

Proceedings of the Sixth International Conference on Innovative Mobile and Internet Services in Ubiquitous Computing, 2012

2011

Probabilistic DCS: An RFID reader-to-reader anti-collision protocol.

[BibT_eX]

[DOI]

J. Netw. Comput. Appl., 2011

Monitoring and Modeling Building Energy Expenditure with Sensor Networks.

[BibT_eX]

Proceedings of the PECCS 2011, 2011

Adaptive Fuzzy-MAC for Power Reduction in Wireless Sensor Networks.

[BibT_eX]

[DOI]

Laura M. Murillo

Proceedings of the 4th IFIP International Conference on New Technologies, 2011

An Adaptive Power-Aware Multi-hop Routing Algorithm for Wireless Sensor Networks.

[BibT_eX]

[DOI]

Laura M. Murillo

Proceedings of the Eighth International Conference on Information Technology: New Generations, 2011

Performance evaluation of reliable and unreliable opportunistic flooding in wireless sensor network.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE International Conference on Networks, 2011

Evaluation Framework of Opportunistic Flooding in Wireless Sensor Networks.

[BibT_eX]

[DOI]

Proceedings of the IEEE/IFIP 9th International Conference on Embedded and Ubiquitous Computing, 2011

2010

Tampering in RFID: A Survey on Risks and Defenses.

[BibT_eX]

[DOI]

Mob. Networks Appl., 2010

Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug.

[BibT_eX]

[DOI]

IET Comput. Digit. Tech., 2010

2009

On Improving Automation by Integrating RFID in the Traceability Management of the Agri-Food Sector.

[BibT_eX]

[DOI]

IEEE Trans. Ind. Electron., 2009

Opportunities and Constraints for Wide Adoption of RFID in Agri-Food.

[BibT_eX]

[DOI]

Int. J. Adv. Pervasive Ubiquitous Comput., 2009

Introducing Probability in RFID Reader-to-Reader Anti-collision.

[BibT_eX]

[DOI]

Proceedings of The Eighth IEEE International Symposium on Networking Computing and Applications, 2009

Random key pre-distribution with transitory master key for wireless sensor networks.

[BibT_eX]

[DOI]

Proceedings of the 5th international student workshop on Emerging networking experiments and technologies, 2009

2007

A System-layer Infrastructure for SoC Diagnosis.

[BibT_eX]

[DOI]

J. Electron. Test., 2007

Design of an UHF RFID transponder for secure authentication.

[BibT_eX]

[DOI]

Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, 2007

Safety Evaluation of NanoFabrics.

[BibT_eX]

[DOI]

Michelangelo Grosso

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

Agri-Food Traceability Management using a RFID System with Privacy Protection.

[BibT_eX]

[DOI]

Claudio Demartini

Proceedings of the 21st International Conference on Advanced Information Networking and Applications (AINA 2007), 2007

2006

A New Hybrid Fault Detection Technique for Systems-on-a-Chip.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 2006

A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries.

[BibT_eX]

[DOI]

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

On the Automation of the Test Flow of Complex SoCs.

[BibT_eX]

[DOI]

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Embedded Memory Diagnosis: An Industrial Workflow.

[BibT_eX]

[DOI]

Proceedings of the 2006 IEEE International Test Conference, 2006

Combined software and hardware techniques for the design of reliable IP processors.

[BibT_eX]

[DOI]

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

Software-Implemented Hardware Fault Tolerance.

[BibT_eX]

[DOI]

Springer, ISBN: 978-0-387-26060-0, 2006

2005

Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores.

[BibT_eX]

[DOI]

Proceedings of the Sixth International Workshop on Microprocessor Test and Verification (MTV 2005), 2005

Integrating BIST Techniques for On-Line SoC Testing.

[BibT_eX]

[DOI]

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

Exploiting an infrastructure IP to reduce memory diagnosis costs in SoCs.

[BibT_eX]

[DOI]

Proceedings of the 10th European Test Symposium, 2005

On-Line Detection of Control-Flow Errors in SoCs by Means of an Infrastructure IP Core.

[BibT_eX]

[DOI]

Proceedings of the 2005 International Conference on Dependable Systems and Networks (DSN 2005), 28 June, 2005

An Integrated Approach for Increasing the Soft-Error Detection Capabilities in SoCs processors.

[BibT_eX]

[DOI]

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005

2004

A New Approach to Software-Implemented Fault Tolerance.

[BibT_eX]

[DOI]

J. Electron. Test., 2004

A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques.

[BibT_eX]

[DOI]

J. Electron. Test., 2004

Using Infrastructure IPs to Support SW-Based Self-Test of Processor Cores.

[BibT_eX]

[DOI]

Proceedings of the Fifth International Workshop on Microprocessor Test and Verification (MTV 2004), 2004

Hybrid Soft Error Detection by Means of Infrastructure IP Cores.

[BibT_eX]

[DOI]

Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

Exploiting an I-IP for In-Field SOC Test.

[BibT_eX]

[DOI]

Proceedings of the 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 2004

Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA.

[BibT_eX]

[DOI]

Alessandro Paccagnella

Proceedings of the 2004 Design, 2004

2003

New techniques for efficiently assessing reliability of SOCs.

[BibT_eX]

[DOI]

Microelectron. J., 2003

Accurate Analysis of Single Event Upsets in a Pipelined Microprocessor.

[BibT_eX]

[DOI]

J. Electron. Test., 2003

Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores.

[BibT_eX]

[DOI]

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Analyzing SEU Effects in SRAM-based FPGAs.

[BibT_eX]

[DOI]

M. Ceschia

Alessandro Paccagnella

Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

An efficient algorithm for the extraction of compressed diagnostic information from embedded memory cores.

[BibT_eX]

[DOI]

Proceedings of 9th IEEE International Conference on Emerging Technologies and Factory Automation, 2003

Soft-Error Detection Using Control Flow Assertions.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

An Accurate Analysis of the Effects of Soft Errors in the Instruction and Data Caches of a Pipelined Microprocessor.

[BibT_eX]

[DOI]

Proceedings of the 2003 Design, 2003

A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories.

[BibT_eX]

[DOI]

Proceedings of the 2003 Design, 2003

2002

Initializability analysis of synchronous sequential circuits.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2002

An FPGA-Based Approach for Speeding-Up Fault Injection Campaigns on Safety-Critical Circuits.

[BibT_eX]

[DOI]

J. Electron. Test., 2002

A Software Fault Tolerance Method for Safety-Critical Systems: Effectiveness and Drawbacks.

[BibT_eX]

[DOI]

Proceedings of the 15th Annual Symposium on Integrated Circuits and Systems Design, 2002

A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques.

[BibT_eX]

[DOI]

Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

Analysis of SEU Effects in a Pipelined Processor.

[BibT_eX]

[DOI]

Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002

Simulation-Based Analysis of SEU Effects on SRAM-based FPGAs.

[BibT_eX]

[DOI]

Proceedings of the Field-Programmable Logic and Applications, 2002

A New Functional Fault Model for FPGA Application-Oriented Testing.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002

2001

A Source-to-Source Compiler for Generating Dependable Software.

[BibT_eX]

[DOI]

Proceedings of the 1st IEEE International Workshop on Source Code Analysis and Manipulation (SCAM 2001), 2001

Exploiting FPGA for Accelerating Fault Injection Experiments.

[BibT_eX]

[DOI]

Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001

FPGA-Based Fault Injection Techniques for Fast Evaluation of Fault Tolerance in VLSI Circuits.

[BibT_eX]

[DOI]

Proceedings of the Field-Programmable Logic and Applications, 2001

Exploiting FPGA-Based Techniques for Fault Injection Campaigns on VLSI Circuits .

[BibT_eX]

[DOI]

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

System safety through automatic high-level code transformations: an experimental evaluation.

[BibT_eX]

[DOI]

Proceedings of the Conference on Design, Automation and Test in Europe, 2001

FPGA-Based Fault Injection for Microprocessor Systems.

[BibT_eX]

[DOI]

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis.

[BibT_eX]

[DOI]

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

2000

Low Power BIST via Non-Linear Hybrid Cellular Automata.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Speeding-Up Fault Injection Campaigns in VHDL Models.

[BibT_eX]

[DOI]

Proceedings of the Computer Safety, 2000

Hardening the Software with Respect to Transient Errors: a Method and Experimental Results.

[BibT_eX]

Proceedings of the 1st Latin American Test Workshop, 2000

Evaluating the Effectiveness of a Software Fault-Tolerance Technique on RISC- and CISC-Based Architectures.

[BibT_eX]

[DOI]

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

New Techniques for Accelerating Fault Injection in VHDL Descriptions.

[BibT_eX]

[DOI]

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

Behavioral-level test vector generation for system-on-chip designs.

[BibT_eX]

[DOI]

Proceedings of the IEEE International High-Level Design Validation and Test Workshop 2000, 2000

Prediction of Power Requirements for High-Speed Circuits.

[BibT_eX]

[DOI]

Proceedings of the Real-World Applications of Evolutionary Computing, 2000

System-level test bench generation in a co-design framework.

[BibT_eX]

[DOI]

Proceedings of the 5th European Test Workshop, 2000

An Experimental Evaluation of the Effectiveness of Automatic Rule-Based Transformations for Safety-Critical Applications.

[BibT_eX]

[DOI]

Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 2000

Evaluating System Dependability in a Co-Design Framework.

[BibT_eX]

[DOI]

Proceedings of the 2000 Design, 2000

Automatic test bench generation for simulation-based validation.

[BibT_eX]

[DOI]

Proceedings of the Eighth International Workshop on Hardware/Software Codesign, 2000

1999

Fault Injection for Embedded Microprocessor-based Systems.

[BibT_eX]

[DOI]

Alfredo Benso

J. Univers. Comput. Sci., 1999

Evaluating the Fault Tolerance Capabilities of Embedded Systems via BDM .

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

FlexFi: A Flexible Fault Injection Environment for Microprocessor-Based Systems.

[BibT_eX]

[DOI]

Alfredo Benso

Proceedings of the Computer Safety, 1999

ALPS: A Peak Power Estimation Tool for Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the 9th Great Lakes Symposium on VLSI (GLS-VLSI '99), 1999

Test Pattern Generation Under Low Power Constraints.

[BibT_eX]

[DOI]

Proceedings of the Evolutionary Image Analysis, 1999

A new BIST architecture for low power circuits.

[BibT_eX]

[DOI]

Proceedings of the 4th European Test Workshop, 1999

Soft-Error Detection through Software Fault-Tolerance Techniques.

[BibT_eX]

[DOI]

Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

Optimal Vector Selection for Low Power BIST.

[BibT_eX]

[DOI]

Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

1998

EXFI: a low-cost fault injection system for embedded microprocessor-based boards.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 1998

The training environment for the course on microprocessor systems at the Politecnico di Torino.

[BibT_eX]

[DOI]

Proceedings of the 1998 workshop on Computer architecture education, 1998

A Test Pattern Generation Methodology for Low-Power Consumption.

[BibT_eX]

[DOI]

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

A fault injection environment for microprocessor-based boards.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

An Integrated HW and SW Fault Injection Environment for Real-Time Systems.

[BibT_eX]

[DOI]

Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

1997

SAARA: a simulated annealing algorithm for test pattern generation for digital circuits.

[BibT_eX]

[DOI]

Proceedings of the 1997 ACM symposium on Applied Computing, 1997

Exploiting Symbolic Techniques within Genetic Algorithms for Power Optimization.

[BibT_eX]

[DOI]

Proceedings of the 9th International Conference on Tools with Artificial Intelligence, 1997

GA-Based Performance Analysis of Network Protocols.

[BibT_eX]

[DOI]

Proceedings of the 9th International Conference on Tools with Artificial Intelligence, 1997

A new Approach for Initialization Sequences Computation for Synchronous Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the Proceedings 1997 International Conference on Computer Design: VLSI in Computers & Processors, 1997

Boolean Function Manipulation on a Parallel System Using BDDs.

[BibT_eX]

[DOI]

Proceedings of the High-Performance Computing and Networking, 1997

Exploiting High-Level Descriptions for Circuits Fault Tolerance Assessments.

[BibT_eX]

[DOI]

Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997

New static compaction techniques of test sequences for sequential circuits.

[BibT_eX]

[DOI]

Proceedings of the European Design and Test Conference, 1997

A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs.

[BibT_eX]

[DOI]

Proceedings of the European Design and Test Conference, 1997

Simulation-based verification of network protocols performance.

[BibT_eX]

Proceedings of the Advances in Hardware Design and Verification, 1997

Exploiting Logic Simulation to Improve Simulation-based Sequential ATPG.

[BibT_eX]

[DOI]

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

A Genetic Algorithm for the Computation of Initialization Sequences for Synchronous Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

Guaranteeing Testability in Re-encoding for Low Power.

[BibT_eX]

[DOI]

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1996

GALLO: a genetic algorithm for floorplan area optimization.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996

GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996

Exploiting Competing Subpopulations for Automatic Generation of Test Sequences for Digital Cicuits.

[BibT_eX]

[DOI]

Proceedings of the Parallel Problem Solving from Nature, 1996

Partial Scan Flip Flop Selection for Simulation-Based Sequential ATPGs.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

Comparing Topological, Symbolic and GA-based ATPGs: An Experimental Approach.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

A Cellular Genetic Algorithm for the Floorplan Area Optimization Problem on a SIMD Architecture.

[BibT_eX]

[DOI]

Proceedings of the High-Performance Computing and Networking, 1996

Using Parallel Genetic Algorithms for Solving the Min-Cut Problem.

[BibT_eX]

[DOI]

Gavril Godza

Proceedings of the High-Performance Computing and Networking, 1996

A Parallel Genetic Algorithm for Automatic Generation of Test Sequences for Digital Circuits.

[BibT_eX]

[DOI]

Proceedings of the High-Performance Computing and Networking, 1996

Fault behavior observation of a microprocessor system through a VHDL simulation-based fault injection experiment.

[BibT_eX]

[DOI]

Proceedings of the conference on European design automation, 1996

On-line Testing of an Off-the-shelf Microprocessor Board for Safety-critical Applications.

[BibT_eX]

[DOI]

Proceedings of the Dependable Computing, 1996

Advanced Techniques for GA-based sequential ATPGs.

[BibT_eX]

[DOI]

Proceedings of the 1996 European Design and Test Conference, 1996

1995

A portable ATPG tool for parallel and distributed systems.

[BibT_eX]

[DOI]

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

An improved data parallel algorithm for Boolean function manipulation using BDDs.

[BibT_eX]

[DOI]

Silvano Gai

Proceedings of the 3rd Euromicro Workshop on Parallel and Distributed Processing (PDP '95), 1995

Exploiting massively parallel architectures for the solution of diffusion and propagation problems.

[BibT_eX]

[DOI]

Proceedings of the High-Performance Computing and Networking, 1995

A PVM tool for automatic test generation on parallel and distributed systems.

[BibT_eX]

[DOI]

Proceedings of the High-Performance Computing and Networking, 1995

GARDA: a diagnostic ATPG for large synchronous sequential circuits.

[BibT_eX]

[DOI]

Proceedings of the 1995 European Design and Test Conference, 1995

1994

A BDD Package For A Massively Parallel SIMD Architecture.

[BibT_eX]

[DOI]

Proceedings of the Second Euromicro Workshop on Parallel and Distributed Processing, 1994

An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms.

[BibT_eX]

[DOI]

Paolo Prinetto

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

GATTO: An Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits.

[BibT_eX]

[DOI]

Proceedings of the Sixth International Conference on Tools with Artificial Intelligence, 1994

A Genetic Algorithm for Floorplan Area Optimization.

[BibT_eX]

[DOI]

Proceedings of the First IEEE Conference on Evolutionary Computation, 1994

Floorplan area optimization using genetic algorithms.

[BibT_eX]

[DOI]

Proceedings of the Fourth Great Lakes Symposium on Design Automation of High Performance VLSI Systems, 1994

1993

An experimental analysis of the effects of migration in parallel genetic algorithms.

[BibT_eX]

[DOI]