Maurice Lousberg

According to our database, Maurice Lousberg authored at least 17 papers between 1998 and 2007.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2007

Diagnosis of Full Open Defects in Interconnecting Lines.

Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

2005

A New Algorithm for Dynamic Faults Detection in RAMs.

Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Memory testing improvements through different stress conditions.

Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen

Proceedings of the 31st European Solid-State Circuits Conference, 2005

Memory Testing Under Different Stress Conditions: An Industrial Evaluation.

Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen

Proceedings of the 2005 Design, 2005

IEEE Std 1500 Compliant Infrastructure forModular SOC Testing.

Tom Waayers, Erik Jan Marinissen, Maurice Lousberg

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2003

On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up.

Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg

J. Electron. Test., 2003

Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.

Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

2002

On IEEE P1500's Standard for Embedded Core Test.

Erik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti, Yervant Zorian

J. Electron. Test., 2002

An Effective Diagnosis Method to Support Yield Improvement.

Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

IP and Automation to Support IEEE P1500.

Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

CTL the language for describing core-based test.

Rohit Kapur, Maurice Lousberg, Tony Taylor, Brion L. Keller, Paul Reuter, Douglas Kay

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Wrapper design for embedded core test.

Yervant Zorian, Erik Jan Marinissen, Maurice Lousberg, Sandeep Kumar Goel

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?

Will R. Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Static component interconnect test technology (SCITT) a new technology for assembly testing.

Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

The role of test protocols in testing embedded-core-based system ICs.

Erik Jan Marinissen, Maurice Lousberg

Proceedings of the 4th European Test Workshop, 1999

1998

A structured and scalable mechanism for test access to embedded reusable cores.

Erik Jan Marinissen, Robert G. J. Arendsen, Gerard Bos, Hans Dingemanse, Maurice Lousberg, Clemens Wouters

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998