Mattias Van Dael

According to our database, Mattias Van Dael authored at least 2 papers between 2015 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2017

Inline discrete tomography system: Application to agricultural product inspection.

Luis Filipe Alves Pereira, Eline Janssens, George D. C. Cavalcanti, Ing Ren Tsang, Mattias Van Dael, Pieter Verboven, Bart M. Nicolaï, Jan Sijbers

Comput. Electron. Agric., 2017

2015

Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system.

Eline Janssens, Jan De Beenhouwer, Mattias Van Dael, Pieter Verboven, Bart M. Nicolaï, Jan Sijbers

Proceedings of the 2015 IEEE International Conference on Image Processing, 2015