Matthias Ludwig

According to our database, Matthias Ludwig authored at least 5 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2023

Counterfeit Detection by Semiconductor Process Technology Inspection.

Matthias Ludwig, Ann-Christin Bette, Bernhard Lippmann, Georg Sigl

Proceedings of the IEEE European Test Symposium, 2023

2022

Automated Defect Inspection in Reverse Engineering of Integrated Circuits.

Ann-Christin Bette, Patrick Brus, Gábor Balázs, Matthias Ludwig, Alois C. Knoll

Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision, 2022

Boundary Enhanced Semantic Segmentation for High Resolution Electron Microscope Images.

Matthias Pollach, Felix Schiegg, Matthias Ludwig, Ann-Christin Bette, Alois C. Knoll

Proceedings of the 30th European Signal Processing Conference, 2022

Physical and Functional Reverse Engineering Challenges for Advanced Semiconductor Solutions.

Bernhard Lippmann, Ann-Christin Bette, Matthias Ludwig, Johannes Mutter, Johanna Baehr, Alexander Hepp, Horst A. Gieser, Nicola Kovac, Tobias Zweifel, Martin Rasche, Oliver Kellermann

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2020

Verification of physical designs using an integrated reverse engineering flow for nanoscale technologies.

Bernhard Lippmann, Niklas Unverricht, Aayush Singla, Matthias Ludwig, Michael Werner, Peter Egger, Anja Dübotzky, Helmut Gräb, Horst A. Gieser, Martin Rasche, Oliver Kellermann

Integr., 2020