Matthew Koskinen
According to our database1,
Matthew Koskinen
authored at least 2 papers
between 2022 and 2023.
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Bibliography
2023
Voltage Ramp Stress Test Optimization for Wafer Level Hot Carrier Monitoring in FinFET.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022