Mathieu Lisart

According to our database, Mathieu Lisart authored at least 20 papers between 2006 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2021

Modeling and Simulating Electromagnetic Fault Injection.

Mathieu Dumont, Mathieu Lisart, Philippe Maurine

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

2019

Electromagnetic Fault Injection : How Faults Occur.

Mathieu Dumont, Mathieu Lisart, Philippe Maurine

Proceedings of the 2019 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2019

2015

Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation.

Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Jean-Max Dutertre, Alexandre Sarafianos

Microelectron. Reliab., 2015

Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation.

Nicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents.

Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology.

Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

Influence of triple-well technology on laser fault injection and laser sensor efficiency.

Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

2014

Electromagnetic analysis and fault injection onto secure circuits.

Paolo Maistri, Régis Leveugle, Lilian Bossuet, Alain Aubert, Viktor Fischer, Bruno Robisson, Nicolas Moro, Philippe Maurine, Jean-Max Dutertre, Mathieu Lisart

Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014

Laser-induced fault effects in security-dedicated circuits.

Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier

Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014

Laser attacks on integrated circuits: From CMOS to FD-SOI.

Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale

Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014

2013

Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell.

Alexandre Sarafianos, Cyril Roscian, Jean-Max Dutertre, Mathieu Lisart, Assia Tria

Microelectron. Reliab., 2013

Voltage Spikes on the Substrate to Obtain Timing Faults.

Karim Tobich, Philippe Maurine, Pierre-Yvan Liardet, Mathieu Lisart, Thomas Ordas

Proceedings of the 2013 Euromicro Conference on Digital System Design, 2013

Robustness improvement of an SRAM cell against laser-induced fault injection.

Alexandre Sarafianos, Mathieu Lisart, Olivier Gagliano, Valerie Serradeil, Cyril Roscian, Jean-Max Dutertre, Assia Tria

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2012

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.

Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2012

2011

Local and Direct EM Injection of Power Into CMOS Integrated Circuits.

François Poucheret, Karim Tobich, Mathieu Lisart, Laurent Chusseau, Bruno Robisson, Philippe Maurine

Proceedings of the 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2011

2010

Modeling Time Domain Magnetic Emissions of ICs.

Victor Lomné, Philippe Maurine, Lionel Torres, Thomas Ordas, Mathieu Lisart, Jérome Toublanc

Proceedings of the Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation, 2010

2009

Electrical modeling of the effect of beam profile for pulsed laser fault injection.

C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart

Microelectron. Reliab., 2009

2008

Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits.

Thomas Ordas, Mathieu Lisart, Etienne Sicard, Philippe Maurine, Lionel Torres

Proceedings of the Integrated Circuit and System Design. Power and Timing Modeling, 2008

2007

Signoff power methodology for contactless smartcards.

Julien Mercier, Christian Dufaza, Mathieu Lisart

Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007

2006

Methodology for Dynamic Power Verification of Contactless Smartcards.

Julien Mercier, Christian Dufaza, Mathieu Lisart

Proceedings of the Integrated Circuit and System Design. Power and Timing Modeling, 2006