Mathias Rommel

According to our database, Mathias Rommel authored at least 9 papers between 2007 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2024

Investigation of CMOS Single Process Steps on 4H-SiC a-Plane Wafers for Quantum Applications.

Jannik H. Schwarberg, Robin Karhu, Birgit Kallinger, Mathias Rommel, Robin Schmidt, Jörg Schulze

Proceedings of the 47th MIPRO ICT and Electronics Convention, 2024

2023

A 4H-SiC CMOS Oscillator-Based Temperature Sensor Operating from 298 K up to 573 K.

Nicola J. Rinaldi, Rosalba Liguori, Alexander May, Chiara Rossi, Mathias Rommel, Alfredo Rubino, Gian Domenico Licciardo, Luigi Di Benedetto

Sensors, December, 2023

A DC SPICE Level 3 Model for 4H-SiC lateral NMOSFET under strong inversion conditions.

Nicola J. Rinaldi, Gian Domenico Licciardo, Luigi Di Benedetto, Mathias Rommel, Tobias Erlbacher

Proceedings of the 18th Conference on Ph.D Research in Microelectronics and Electronics, 2023

Design and Characterization of a Data Converter in a SiC CMOS Technology for Harsh Environment Sensing Applications.

Yunfan Niu, Jiarui Mo, Alexander May, Mathias Rommel, Chiara Rossi, Joost Romijn, Guoqi Zhang, Sten Vollebregt

Proceedings of the 2023 IEEE SENSORS, Vienna, Austria, October 29 - Nov. 1, 2023, 2023

2018

Normalized differential conductance to study current conduction mechanisms in MOS structures.

T. H. Nouibat, Zitouni Messai, D. Chikouch, Zahir Ouennoughi, N. Rouag, Mathias Rommel, Lothar Frey

Microelectron. Reliab., 2018

2017

Waveguide Bragg Gratings in Ormocer^®s for Temperature Sensing.

Maiko Girschikofsky, Manuel Rosenberger, Michael Förthner, Mathias Rommel, Lothar Frey, Ralf Hellmann

Sensors, 2017

2015

Current conduction mechanism of MIS devices using multidimensional minimization system program.

N. Rouag, Zahir Ouennoughi, Mathias Rommel, Katsuhisa Murakami, Lothar Frey

Microelectron. Reliab., 2015

2013

Melt depth and time variations during pulsed laser thermal annealing with one and more pulses.

Moritz Hackenberg, Mathias Rommel, Maximilian Rumler, Jürgen Lorenz, Peter Pichler, Karim Huet, Razvan Negru, Giuseppe Fisicaro, Antonino La Magna, Nadjib Taleb, Maurice Quillec

Proceedings of the European Solid-State Device Research Conference, 2013

2007

Quantitative oxide charge determination by photocurrent analysis.

Mathias Rommel, Anton J. Bauer, Heiner Ryssel

Microelectron. Reliab., 2007