Mathias Poik

IEEE Trans. Instrum. Meas., 2024

2023

Model-Based RF Sensing for Contactless High-Resolution Voltage Measurements.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2023

Heterodyne AC Kelvin Probe Force Microscopy for Nanoscale Surface Potential Imaging in Liquids.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2023

Analysis of Cross-Talk Induced Measurement Errors in Model-Based RF Voltage Sensing.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2023

Quantitative Surface Potential Measurements by AC Electrostatic Force Microscopy.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2023

2022

Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2022

DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force Microscopy.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2022

Electrostatic Actuation of AFM Cantilevers in Aqueous Solutions.

[BibT_eX]

[DOI]

Proceedings of the IEEE/ASME International Conference on Advanced Intelligent Mechatronics, 2022

2021

A Mechatronic Lock-In Amplifier: Integrating Demodulation in Sensor Electronics for Measuring Mechanical Oscillations.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2021

Atomic Force Microscopy Breaking Through the Vertical Range-Bandwidth Tradeoff.

[BibT_eX]

[DOI]

IEEE Trans. Ind. Electron., 2021

2020

Efficient Demodulation for Measuring the Amplitude of Mechanical Oscillations.

[BibT_eX]

[DOI]

Proceedings of the 2020 IEEE International Instrumentation and Measurement Technology Conference, 2020

2018

Similarity-based Feedback Control for Linear Operation of Piezoelectric Actuators.

[BibT_eX]

[DOI]

Dominik Kohl