Mateo Rendón

According to our database¹, Mateo Rendón authored at least 2 papers in 2024.

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2024

Enhanced Wear-Out Sensor Design in a 12nm Process for Separable Stress Regime Monitoring.

[BibT_eX]

[DOI]

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

A Novel Induced Offset Voltage Sensor for Separable Wear-Out Mechanism Characterization in a 12nm FinFET Process.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2024