Massimo Vanzi

According to our database, Massimo Vanzi authored at least 47 papers between 1986 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Identifying the lights position in photometric stereo under unknown lighting.

Anna Concas, Riccardo Dessì, Caterina Fenu, Giuseppe Rodriguez, Massimo Vanzi

Proceedings of the 2021 21st International Conference on Computational Science and Its Applications (ICCSA), Cagliari, Italy, September 13-16, 2021, 2021

2018

Further improvements of an extended Hakki-Paoli method.

Massimo Vanzi, Giovanna Mura, G. Martines

Microelectron. Reliab., 2018

2017

Practical optical gain by an extended Hakki-Paoli method.

Massimo Vanzi, Giulia Marcello, Giovanna Mura, G. Le Galès, S. Joly, Yannick Deshayes, Laurent Béchou

Microelectron. Reliab., 2017

2016

ESD tests on 850 nm GaAs-based VCSELs.

Massimo Vanzi, Giovanna Mura, Giulia Marcello, Kunhui Xiao

Microelectron. Reliab., 2016

2015

Clamp voltage and ideality factor in laser diodes.

Massimo Vanzi, Giovanna Mura, Giulia Marcello, G. Martines

Microelectron. Reliab., 2015

Recent improvements in photometric stereo for rock art 3D imaging.

Riccardo Dessì, Carla Mannu, Giuseppe Rodriguez, Giuseppa Tanda, Massimo Vanzi

Digit. Appl. Archaeol. Cult. Heritage, 2015

2014

FIB-induced electro-optical alterations in a DFB InP laser diode.

Giovanna Mura, Massimo Vanzi, Giulia Marcello

Microelectron. Reliab., 2014

2013

XEBIC at the Dual Beam.

Massimo Vanzi, Simona Podda, Elodia Musu, Robert Cao

Microelectron. Reliab., 2013

Optical losses in single-mode laser diodes.

Massimo Vanzi, Giovanna Mura, M. Marongiu, T. Tomasi

Microelectron. Reliab., 2013

The role of the optical trans-characteristics in laser diode analysis.

Giovanna Mura, Massimo Vanzi, Giulia Marcello, Robert Cao

Microelectron. Reliab., 2013

"Hot-plugging" of LED modules: Electrical characterization and device degradation.

Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2013

Thermal and electrical investigation of the reverse bias degradation of silicon solar cells.

Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso

Microelectron. Reliab., 2013

2012

Chip and package-related degradation of high power white LEDs.

Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2012

Phosphors for LED-based light sources: Thermal properties and reliability issues.

Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2012

2011

DC parameters for laser diodes from experimental curves.

Massimo Vanzi, Giovanna Mura, G. Martines

Microelectron. Reliab., 2011

An original DoE-based tool for silicon photodetectors EoL estimation in space environments.

Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi

Microelectron. Reliab., 2011

2010

Editorial.

Massimo Vanzi

Microelectron. Reliab., 2010

The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis.

Giovanna Mura, Massimo Vanzi

Microelectron. Reliab., 2010

2009

Lot reliability issues in commercial off the shelf (COTS) microelectronic devices.

Giovanna Mura, Massimo Vanzi

Microelectron. Reliab., 2009

2008

An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy.

Ruggero Pintus, Simona Podda, Massimo Vanzi

IEEE Trans. Instrum. Meas., 2008

Sulfur-contamination of high power white LED.

Giovanna Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi

Microelectron. Reliab., 2008

A model for the DC characteristics of a laser diode.

Massimo Vanzi

Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008

2007

High temperature electro-optical degradation of InGaN/GaN HBLEDs.

Matteo Meneghini, Lorenzo Trevisanello, C. Sanna, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2007

Life begins at 65: unless you are mixed signal?

Reimund Wittmann, Massimo Vanzi, Hans-Joachim Wassener, Navraj Nandra, Joachim Kunkel, José E. da Franca, Christian Münker

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

High brightness GaN LEDs degradation during dc and pulsed stress.

Matteo Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni

Microelectron. Reliab., 2006

Failure Analysis-assisted FMEA.

G. Cassanelli, Giovanna Mura, Fausto Fantini, Massimo Vanzi, Bernard Plano

Microelectron. Reliab., 2006

2005

Image alignment for 3D reconstruction in a SEM.

Ruggero Pintus, Simona Podda, Massimo Vanzi

Microelectron. Reliab., 2005

Reliability predictions in electronic industrial applications.

G. Cassanelli, Giovanna Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini

Microelectron. Reliab., 2005

Video Streaming in Electron Microscopy Applications.

Francesca Mighela, Cristian Perra, Massimo Vanzi

Proceedings of the Visual Content Processing and Representation, 2005

2004

Failure Analysis of RuO₂ Thick Film Chip Resistors.

Simona Podda, G. Cassanelli, Fausto Fantini, Massimo Vanzi

Microelectron. Reliab., 2004

Quantitative 3D reconstruction from BS imaging.

Ruggero Pintus, Simona Podda, Francesca Mighela, Massimo Vanzi

Microelectron. Reliab., 2004

Failure analysis of RFIC amplifiers.

Giovanna Mura, Massimo Vanzi, G. Micheletti

Microelectron. Reliab., 2004

2003

On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices.

Giovanna Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner

Microelectron. Reliab., 2003

Reliability of visible GaN LEDs in plastic package.

Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, Gaetano Scamarcio, Giovanna Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich

Microelectron. Reliab., 2003

2002

Reliability tests on WDM filters.

Massimo Vanzi, Giulia Salmini, R. Pastorelli, S. Pessina, Paola Furcas

Microelectron. Reliab., 2002

ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology.

Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Giovanna Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2002

Backside Failure Analysis of GaAs ICs after ESD tests.

Gaudenzio Meneghesso, A. Cocco, Giovanna Mura, Simona Podda, Massimo Vanzi

Microelectron. Reliab., 2002

An automated lifetest equipment for optical emitters.

M. Giglio, G. Martines, Giovanna Mura, Simona Podda, Massimo Vanzi

Microelectron. Reliab., 2002

Editorial.

Fausto Fantini, Massimo Vanzi

Microelectron. Reliab., 2002

A specimen-current branching approach for FA of long Electromigration test lines.

C. Caprile, Ilaria De Munari, Maurizio Impronta, Simona Podda, Andrea Scorzoni, Massimo Vanzi

Microelectron. Reliab., 2002

2001

Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs.

Gaudenzio Meneghesso, Simona Podda, Massimo Vanzi

Microelectron. Reliab., 2001

Damp Heat test on LiNbO optical modulators.

Paola Furcas, Rosaria De Palo, Maria Elena Patella, Giulia Salmini, Massimo Vanzi

Microelectron. Reliab., 2001

Editorial.

Daniel L. Barton, Shigeru Nakajima, Massimo Vanzi

Microelectron. Reliab., 2001

1988

Measurement of the local latch-up sensitivity by means of computer-controller scanning electron microscopy.

Claudio Canali, Manuela Giannini, Andrea Scorzoni, Massimo Vanzi, Enrico Zanoni

IEEE J. Solid State Circuits, April, 1988

A physically based mobility model for numerical simulation of nonplanar devices.

Claudio Lombardi, Stefano Manzini, Antonio Saporito, Massimo Vanzi

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988

1987

An Extension to Newton's Method in Device Simulators--On An Efficient Algorithm to Evaluate Small-Signal Parameters and to Predict Initial Guess.

Zhiping Yu, Robert W. Dutton, Massimo Vanzi

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1987

1986

A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's.

Claudio Turchetti, P. Prioretti, Guido Masetti, E. Profumo, Massimo Vanzi

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1986