Massimo Lanzoni

Affiliations:
  • University of Bologna, Italy


According to our database1, Massimo Lanzoni authored at least 15 papers between 1989 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2024
A Novel Approach to Raman Distributed Temperature-Sensing System for Short-Range Applications.
Sensors, May, 2024

2009
Smart sensors for fast biological analysis.
Microelectron. J., 2009

2006
Linux-Based Data Acquisition and Processing on Palmtop Computer.
IEEE Trans. Instrum. Meas., 2006

Innovative Optoeletronic Approaches to Biomolecular Analysis with Arrays of Silicon Devices.
Proceedings of the VLSI-SoC: Research Trends in VLSI and Systems on Chip, 2006

Innovative Optoelectronic Approaches to Biomolecular Analysis with Arrays of Silicon Devices.
Proceedings of the IFIP VLSI-SoC 2006, 2006

2005
Hardware-Software Design of a Smart Sensor for Fully-Electronic DNA Hybridization Detection.
Proceedings of the 2005 Design, 2005

2003
Program schemes for multilevel flash memories.
Proc. IEEE, 2003

2001
Optimized programming of multilevel flash EEPROMs.
Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001

1998
Nonvolatile multilevel memories for digital applications.
Proc. IEEE, 1998

Automatic and continuous offset compensation of MOS operational amplifiers using floating-gate transistors.
IEEE J. Solid State Circuits, 1998

1995
Experimental characterization of circuits for controlled programming of floating-gate MOSFET's.
IEEE J. Solid State Circuits, June, 1995

1994
A novel approach to controlled programming of tunnel-based floating-gate MOSFETs.
IEEE J. Solid State Circuits, February, 1994

1990
Testing of E<sup>2</sup>PROM aging and endurance: A case study.
Eur. Trans. Telecommun., 1990

An improved procedure to test CMOS ICs for latch-up.
Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1989
A Testing Technique to Characterize E^2PROM's Aging and Endurance.
Proceedings of the Proceedings International Test Conference 1989, 1989


  Loading...