Massimo Boscaglia
According to our database1,
Massimo Boscaglia
authored at least 2 papers
between 2021 and 2022.
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Bibliography
2022
Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Effect of interface and bulk charges on the breakdown of nitrided gate oxide on 4H-SiC.
Proceedings of the IEEE International Reliability Physics Symposium, 2021