Massimo Boscaglia

According to our database1, Massimo Boscaglia authored at least 2 papers between 2021 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2022
Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
Effect of interface and bulk charges on the breakdown of nitrided gate oxide on 4H-SiC.
Proceedings of the IEEE International Reliability Physics Symposium, 2021


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