Masayuki Kawabata

According to our database, Masayuki Kawabata authored at least 11 papers between 2005 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2021

High-speed measurement of Piezoelectric MEMS equivalent circuit parameters by Swept-sine and PRBS signals.

Mitsuo Matsumoto, Masayuki Kawabata, Yukio Kawanabe

Proceedings of the IEEE International Test Conference in Asia, 2021

2017

Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE.

Masayuki Kawabata, Koji Asami, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi

Proceedings of the International Test Conference in Asia, 2017

2016

Rectangular Waveform Generation with Harmonics Suppression.

Masayuki Kawabata, Koji Asami, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi

Proceedings of the 25th IEEE Asian Test Symposium, 2016

2015

A new method for measuring alias-free aperture jitter in an ADC output.

Takahiro J. Yamaguchi, Katsuhiko Degawa, Masayuki Kawabata, Masahiro Ishida, Koichiro Uekusa, Mani Soma

Proceedings of the 2015 IEEE International Test Conference, 2015

2012

Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost.

Masahiro Ishida, Kiyotaka Ichiyama, Tasuku Fujibe, Daisuke Watanabe, Masayuki Kawabata

IEEE Des. Test Comput., 2012

2011

Real-time testing method for 16 Gbps 4-PAM signal interface.

Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu

Proceedings of the 2011 IEEE International Test Conference, 2011

2010

A Self-Calibration Technique for Capacitor Mismatch Errors of an Interleaved SAR ADC.

Yasuhide Kuramochi, Masayuki Kawabata, Koichiro Uekusa, Akira Matsuzawa

IEICE Trans. Electron., 2010

2009

A 0.027-mm² Self-Calibrating Successive Approximation ADC Core in 0.18-µm CMOS.

Yasuhide Kuramochi, Akira Matsuzawa, Masayuki Kawabata

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2009

2008

A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing.

Takahiro J. Yamaguchi, Masayuki Kawabata, Mani Soma, Masahiro Ishida, K. Sawami, Koichiro Uekusa

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

HTS Sampler with Improved Circuit Design and Layout.

Michitaka Maruyama, Hironori Wakana, Tsunehiro Hato, Hideo Suzuki, Keiichi Tanabe, Koichiro Uekusa, Takeshi Konno, Nobuya Sato, Masayuki Kawabata

IEICE Trans. Electron., 2007

2005

Graph-based Approach to Context-adaptable PNS and its Application Scenarios.

Masayuki Kawabata, Ryo Nishide, Mayumi Ueda, Shinichi Ueshima

Proceedings of the 21st International Conference on Data Engineering Workshops, 2005