Masayoshi Tachibana
According to our database1,
Masayoshi Tachibana
authored at least 13 papers
between 1986 and 2018.
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Bibliography
2018
Phase difference analysis technique for parametric faults BIST in CMOS analog circuits.
IEICE Electron. Express, 2018
Robustification of a One-Dimensional Generic Sigmoidal Chaotic Map with Application of True Random Bit Generation.
Entropy, 2018
2017
IEICE Electron. Express, 2017
2015
Proceedings of the 15th International Symposium on Communications and Information Technologies, 2015
Proceedings of the 15th International Symposium on Communications and Information Technologies, 2015
2013
A resistance matching based self-testable current-mode R-2R digital-to-analog converter.
IEICE Electron. Express, 2013
2012
IEICE Electron. Express, 2012
2011
A BIST scheme for operational amplifier by checking the stable output of transient response.
Proceedings of the 20th European Conference on Circuit Theory and Design, 2011
2010
A Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard.
IEICE Trans. Inf. Syst., 2010
A low-jitter supply-regulated charge pump phase-locked loop with built-in test and calibration.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
2009
Simultaneous impulse stimulation and response sampling technique for built-in self test of linear analog integrated circuits.
Proceedings of the 22st Annual Symposium on Integrated Circuits and Systems Design: Chip on the Dunes, 2009
1989
Proceedings of the Computer Design: VLSI in Computers and Processors, 1989
1986
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1986