Masashi Higashino
According to our database1,
Masashi Higashino
authored at least 3 papers
between 2015 and 2017.
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Bibliography
2017
Proceedings of the 2017 International Symposium on Intelligent Signal Processing and Communication Systems, 2017
2015
A study on HCI induced gate leakage current model used for reliability simulations in 90nm n-MOSFETs.
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015
Study on maximum electric field modeling used for HCI induced degradation characteristic of LDMOS transistors.
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015