Masaru Sanada

According to our database, Masaru Sanada authored at least 7 papers between 1996 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2008

Voltage-based fault path tracing by transistor operating point analysis.

Masaru Sanada

Microelectron. Reliab., 2008

2006

Fault diagnosis technology based on transistor behavior analysis for physical analysis.

Masaru Sanada, Yutaka Yoshizawa

Microelectron. Reliab., 2006

Defect Diagnosis - Reasoning Methodology.

Yasuo Sato, Kazushi Sugiura, Reisuke Shimoda, Yutaka Yoshizawa, Kenji Norimatsu, Masaru Sanada

Proceedings of the 15th Asian Test Symposium, 2006

2004

Layout-Based Detection Technique of Line Pairs with Bridging Fault Using <i>I</i>_DDQ.

Masaru Sanada

IEICE Trans. Inf. Syst., 2004

2001

Defect Detection from Visual Abnormalities in Manufacturing Process Using IDDQ.

Masaru Sanada

J. Electron. Test., 2001

2000

Defect detection from visual abnormalities in manufacturing process using I_DDQ.

Masaru Sanada

Proceedings of the 5th European Test Workshop, 2000

1996

A CAD-based approach to failure diagnosis of CMOS LSI's using abnormal Iddq.

Masaru Sanada

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996