Masao Aso

According to our database, Masao Aso authored at least 6 papers between 2009 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Innovative Test Practices in Asia.

Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Yukiya Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, Kazumi Hatayama

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test.

Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yukiya Miura

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

2013

A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing.

Kohei Miyase, Ryota Sakai, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara

IEICE Trans. Inf. Syst., 2013

2012

A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits.

Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

2011

Transition-Time-Relation based capture-safety checking for at-speed scan test generation.

Kohei Miyase, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara

Proceedings of the Design, Automation and Test in Europe, 2011

2009

CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing.

Kazunari Enokimoto, Xiaoqing Wen, Yuta Yamato, Kohei Miyase, H. Sone, Seiji Kajihara, Masao Aso, Hiroshi Furukawa

Proceedings of the Eighteentgh Asian Test Symposium, 2009