Masamichi Suzuki
According to our database1,
Masamichi Suzuki
authored at least 6 papers
between 2010 and 2023.
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Collaborative distances:
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Bibliography
2023
Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2017
Error Tolerance Analysis of Deep Learning Hardware Using a Restricted Boltzmann Machine Toward Low-Power Memory Implementation.
IEEE Trans. Circuits Syst. II Express Briefs, 2017
Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface.
Microelectron. Reliab., 2017
2013
Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits.
Proceedings of 2013 International Conference on IC Design & Technology, 2013
2010
Detailed investigation of the effects of La and Al content on the electrical characteristics and reliability properties of La-Al-O gate dielectrics.
Microelectron. Reliab., 2010